Theoretical Description of Near-Field Optical Microscope
In this chapter, we study the basic electromagnetic processes involved in near-field optical microscopes (NOM) from the theoretical viewpoint of the multiple scattering of a vector field. The purpose is to examine the localization of the near-field interaction between small dielectric objects. Such a process is relevant to the near-field detection of near-field phenomena. We will show how we can obtain information about localized electromagnetic interactions between small objects.
KeywordsEvanescent Wave Scattered Field Angular Spectrum Dielectric Sphere Spherical Representation
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- 2.M. Born and E. Wolf, Principles of Optics, 3rd ed., Pergamon Press, Oxford, 1965.Google Scholar
- 4.P. M. Morse and H. Feshbach, Methods of Theoretical Physics, Part 1, McGraw-Hill, New York, 1953.Google Scholar
- 5.P. M. Morse and H. Feshbach, Methods of Theoretical Physics, Part 2, McGraw-Hill, New York, 1953.Google Scholar
- 12.L. D. Landau and E. M. Lifshitz, Quantum Mechanics (Non-relativistic Theory), 3rd ed., Pergamon Press, Oxford, 1977.Google Scholar
- 13.V. B. Berestetskii, E. M. Lifshitz, and L. P. Pitaevskii, Quantum Electrodynamics, 2nd ed., Pergamon Press, Oxford, 1982.Google Scholar
- 14.C. Cohen-Tannoudji, J. Dupont-Roc, and G. Grynberg, Photon and Atoms, Wiley, New York, 1989.Google Scholar
- 15.A. Messiah, Quantum Mechanics, North-Holland, Amsterdam, 1961.Google Scholar