Theoretical Description of Near-Field Optical Microscope
In this chapter, we study the basic electromagnetic processes involved in near-field optical microscopes (NOM) from the theoretical viewpoint of the multiple scattering of a vector field. The purpose is to examine the localization of the near-field interaction between small dielectric objects. Such a process is relevant to the near-field detection of near-field phenomena. We will show how we can obtain information about localized electromagnetic interactions between small objects.
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