A Real-Time Phase Unwrapping Algorithm For EPSI Material Deformation Measurements

  • J. L. Blackshire
  • R. C. Hardie
  • M. I. Younus
Chapter
Part of the Review of Progress in Quantitative Nondestructive Evaluation book series (RPQN, volume 18 A)

Abstract

Electronic Phase-Stepped Interferometry (EPSI) is a laser-based NDE technique capable of providing out-of-plane displacement and surface topography measurements on the order of a nanometer [1]. The technique has the potential for providing real-time measurement capabilities provided data capture and data reduction rates could be minimized. This in turn could provide an opportunity for studying and characterizing surface defect information in advanced materials such as Ti-6A1-4V and A120204-T3 using time-sequenced studies and methods. The possibility of characterizing defect precursor information may then become possible through time-evolution history studies.

Keywords

Titanium 

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References

  1. 1.
    K. Creath, “Phase Shifting Speckle Interferometry,” Applied Optics, 24(18), 1984.Google Scholar
  2. 2.
    R. Hardie, M. Younus, and J. Blackshire, “Robust Phase-Unwrapping Algorithm with a Spatial Binary-Tree Image Decomposition,” Applied Optics, 37(20), July 1998.Google Scholar

Copyright information

© Springer Science+Business Media New York 1999

Authors and Affiliations

  • J. L. Blackshire
    • 1
  • R. C. Hardie
    • 1
  • M. I. Younus
    • 1
  1. 1.Department of Electrical and Computer EngineeringUniversity of DaytonDaytonUSA

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