Nanoscale Viscoelastic Characterization Using Tapping Mode AFM

  • L. Wang
  • K. Wu
  • S. I. Rokhlin
Chapter
Part of the Review of Progress in Quantitative Nondestructive Evaluation book series (RPQN, volume 18 A)

Abstract

The tapping mode atomic force microscopy (AFM) has been widely used as a tool to image sample surfaces [1–3]. It has been modeled as a single degree-of-freedom nonlinear oscillator [4–11], In this model, the tip-sample interactions are described by contact theory with adhesion (Johnson-Kendall-Roberts (JKR) theory) [12–14]. The viscoelasticity is considered as a friction force by adding a damping constant. Magonov and Elings [15] presented experimental results which show different phase sensitivity for stiff and soft samples. Anczykowski et al.[16] presented results on amplitude vs. tip-sample separation and showed the existence of hysteresis due to nonlinearity and the transition between attractive and repulsive forces. Kuhle et al [17] demonstrated experimentally the frequency response hysteresis and pointed out the effect of attractive force on this hysteresis using a linear interaction force approximation.

Keywords

Polyethylene 

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Copyright information

© Springer Science+Business Media New York 1999

Authors and Affiliations

  • L. Wang
    • 1
  • K. Wu
    • 1
  • S. I. Rokhlin
    • 1
  1. 1.Nondestructive Evaluation Program Edison Joining Technology CenterThe Ohio State UniversityColumbusUSA

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