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Introduction

  • Patrick C. McGeer
  • Robert K. Brayton
Part of the The Springer International Series in Engineering and Computer Science book series (SECS, volume 139)

Abstract

The two classic parameters of integrated circuit design are speed and area. The cost of an integrated circuit is linearly related to the yield (that is, to the percentage of instances of the circuit which function correctly). In turn, yield is inversely related to the probability of a fatal defect in the material substrate, which is exponentially related to active area of the circuit. Hence, to a first approximation, the cost of an integrated circuit is a function of the area of the circuit.

Keywords

Boolean Function Case Analysis Critical Path Longe Path Delay Model 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1991

Authors and Affiliations

  • Patrick C. McGeer
    • 1
  • Robert K. Brayton
    • 2
  1. 1.University of British ColumbiaCanada
  2. 2.University of CaliforniaUSA

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