Abstract
Zinc selenide possesses a number of valuable physical properties: high photosensitivity, electrooptical effect, piezo effect, and high refractive index [1]. Due to a wide forbidden band (2.8 eV at 4.2 K), ZnSe emits in the blue spectral region which makes it a promising material for use in light-emitting devices. However, the physical properties of ZnSe are exceedingly sensitive to variations of chemical composition and to the actual crystal structure of the specimens. The type of faults which arise in the crystal and their concentration and distribution are determined by the growth mechanisms, incorporation and diffusion of dopants, and by the temperature. Therefore, they depend intricately on the method and conditions of crystal growth [2].
Deceased
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
A. N., Georgobiani, “Wide band AIIBVI semiconductors and prospects for their use,” Usp. Fiz. Nauk, 113, 129–155 (1974).
I. P., Kalinkin, B. V., Aleskovskii, and A. V., Simashkevich, Epitaxial Films of A IIBVI Compounds [in Russian], Leningrad State Univ. (1978).
T. Yao and S. Maekava, “Molecular beam epitaxy of zinc chalcogenides,” J. Cryst. Growth, 53, 423–431 (1981).
S. A., Semiletov, V. Ch., Stankevich, and A. A., Tikhonova, “Heteroepitaxy of ZnSe on GaAs,” Izv. Akad. Nauk SSSR, Ser Fiz., 50, No.3, 505–508 (1986).
S. A., Semiletov, V. Ch., Stankevich, and A. A., Tikhonova, “Electron diffraction study of epitaxial ZnSe films,” Izv. Akad. Nauk SSSR, Ser Fiz., 48, No.9, 1744–1747 (1984).
D. W., Pushley and M. J., Stowell, “Electron microscopy and diffraction of twinned structures in evaporated films of gold,” Philos. Mag., 8, 1605–1632 (1963).
Y. Tarui, Y., Komiga, and Y., Harada, “Preferential etching and etched profile of GaAs,” J. Electrochem Soc., 118, 48 (1971).
T. Yao, M. Ogura, P. Natsuoka, et al., “Electrical and photoluminescence properties of ZnSe thin films grown by molecular beam epitaxy: substrate temperature effect,” Jpn. J. Appl Phys., 22, No.3, L144 (1983).
J. O., Williams, T. L., Ng, A. C., Wright, et al., “High resolution transmission and analytical electron microscopy for characterization of epilayers and interfaces in MOVPE growth of ZnSe1-ySy,” J. Cryst. Growth, 72, No.1/2, 155–161 (1985).
V. Ch., Stankevich, “Features of growth and structure of epitaxial ZnSe layers on GaAs prepared in a quasisealed container,” Candidate’s Dissertation in Physical-Mathematical Sciences, Moscow (1986).
Faults in Crystalline Semiconductors: A Collection of Articles [Russian translation], Mir, Moscow (1969).
B. Cockayne, P. J. Wright, M. S., Scolnick, et al., “The growth by MOCVD using new group VI sources and assessment by HRTEM and CL of Zn-based II-VI single crystal layers,” J. Cryst. Growth, 12, No.1/2, 17–22 (1985).
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1991 Consultants Bureau, New York
About this chapter
Cite this chapter
Galstyan, V.G., Deigen, M.I., Muratova, V.I., Semiletov, A., Stankevich, V.C., Tikhonova, A.A. (1991). Relation Between Growth Conditions, Structure, and Cathodoluminescence of Epitaxial Layers of Znse on GaAs. In: Bagdasarov, K.S., Lube, É.L. (eds) Growth of Crystals. Growth of Crystals, vol 16. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-3662-8_9
Download citation
DOI: https://doi.org/10.1007/978-1-4615-3662-8_9
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-306-18116-0
Online ISBN: 978-1-4615-3662-8
eBook Packages: Springer Book Archive