Advertisement

Eddy Current Crack Signals in Small Diameter Tubing

  • Steven Ross
  • William Lord
Part of the Advances in Cryogenic Engineering book series (volume 28)

Abstract

Eddy current nondestructive testing methods are effective for the detection of cracks in conducting materials. However, to insure that the detection is reliable an accurate reference standard must be used in instrument calibration. Electrical-discharge-machined (EDM) notches have been used as a reference standard for fatigue cracks (1, 2). However, many researchers argue that an EDM notch gives a larger signal than an actual fatigue crack (3, 4) and thus cannot be used as an equivalent model. Much of the previous research on this topic was done with a probe over a flat block. This paper discusses the case of a probe inside a tube with cracks growing from the outer diameter. The focus of this investigation is to compare actual fatigue crack signals with signals from EDM notches and a finite element simulation.

Keywords

Fatigue Crack Fatigue Crack Growth Crack Depth Differential Probe Small Diameter Tubing 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    W. L. Zemberry, Mat. Eval., Vol. 28, p. 81 (1970).Google Scholar
  2. 2.
    D. A. Hagemaier and J. A. Register, Mat. Eval., Vol. 48, p. 50 (1990).Google Scholar
  3. 3.
    W. D. Rummel, J. C. Moulder, N. Nakagawa, Review of Progress in Quantitative NDE, edited by D. O. Thompson and D. E. Chimenti (Plenum Press, New York, 1990), Vol. 10A, p. 277.Google Scholar
  4. 4.
    J. Hartman, Review of Progress in Quantitative NDE, opsit, (Plenum Press, New York, 1990), Vol. 10A, p. 285.Google Scholar
  5. 5.
    H. Quong, SSME Heat Exchanger Coil Weld Nondestructive Inspection Review, BC 87–C32,(1987).Google Scholar
  6. 6.
    R. Palanisamy and W. Lord, IEEE Trans. MAG, Vol. 15, No. 6, p. 1479, (1979).CrossRefGoogle Scholar
  7. 7.
    W. Lord, IEEE Trans. MAG, Vol. 19, No. 6, p. 2437 (1983).CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1992

Authors and Affiliations

  • Steven Ross
    • 1
  • William Lord
  1. 1.Department of Electrical Engineering and Computer EngineeringIowa State UniversityAmesUSA

Personalised recommendations