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Surface Coverage Issues When Using Eddy Current Arrays

  • K. H. Hedengren
  • P. J. Howard
Part of the Advances in Cryogenic Engineering book series (volume 28)

Abstract

Over the past few years, the need for improved flaw detection sensitivity has motivated the development of imaging techniques for eddy current testing [1]. The imaging approach has a major advantage over more traditional eddy current detection methods as image processing routines may be applied to the eddy current images to enhance flaw detection capability. Smaller probes are also being developed to further improve the resolution and sensitivity of flaw detection. The use of smaller probes, however, requires shorter data acquisition sampling intervals. This forces a tradeoff between inspection resolution and inspection speed. The need for simultaneous improvement in both inspection resolution and speed has stimulated an interest in eddy current arrays. As a result, a powerful new eddy current array inspection technology is emerging.

Keywords

Flaw Detection Array Element Array Configuration Eddy Current Testing Array Response 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1992

Authors and Affiliations

  • K. H. Hedengren
    • 1
  • P. J. Howard
    • 1
  1. 1.General Electric Corporate Research & DevelopmentSchenectadyUSA

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