Statistical Pattern Classification
No new engineering or scientific technique, however novel, evolves in isolation. Both Hidden Markov Model (HMM) and Multilayer Perceptron (MLP) based approaches have been developed in the context of a long history of pattern recognition technology. Though specific methods are changing, the pattern recognition perspective continues to be useful for the description of many problems and their proposed solutions.
KeywordsFeature Vector Posterior Probability Hide Markov Model Discriminant Function Speech Recognition
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