Statistical Pattern Classification

  • Hervé A. Bourlard
  • Nelson Morgan
Part of the The Springer International Series in Engineering and Computer Science book series (SECS, volume 247)

Abstract

No new engineering or scientific technique, however novel, evolves in isolation. Both Hidden Markov Model (HMM) and Multilayer Perceptron (MLP) based approaches have been developed in the context of a long history of pattern recognition technology. Though specific methods are changing, the pattern recognition perspective continues to be useful for the description of many problems and their proposed solutions.

Keywords

Covariance Extractor 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Copyright information

© Springer Science+Business Media New York 1994

Authors and Affiliations

  • Hervé A. Bourlard
    • 1
    • 2
  • Nelson Morgan
    • 2
    • 3
  1. 1.Lernout & Hauspie Speech ProductsBelgium
  2. 2.International Computer Science InstituteBerkeleyUSA
  3. 3.University of CaliforniaBerkeleyUSA

Personalised recommendations