Modeling of Skin Effect in TLM
The transmission line matrix (TLM) method [1, 2, 3] is an efficient method for time-domain analysis of electromagnetic fields. For the modeling of long interconnection lines within planar circuits, the conductor losses have to be considered. The discretization of thin conducting sheets in a usual TLM scheme is not applicable, because the number of nodes within the TLM mesh will increase extremely, when the penetration depths in the metallic sheet are small compared to the other geometric parameters such as line width and substrate height. On the other hand the use of large gridding factors to reduce the number of nodes will cause stability problems and the excitation of spurious modes will be inevitable. Therefore the thin conducting sheets have to be described by a seperate model enclosed in a TLM mesh modeling the environment.
KeywordsPermeability Microwave Gridding
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