Modeling of Skin Effect in TLM
The transmission line matrix (TLM) method [1, 2, 3] is an efficient method for time-domain analysis of electromagnetic fields. For the modeling of long interconnection lines within planar circuits, the conductor losses have to be considered. The discretization of thin conducting sheets in a usual TLM scheme is not applicable, because the number of nodes within the TLM mesh will increase extremely, when the penetration depths in the metallic sheet are small compared to the other geometric parameters such as line width and substrate height. On the other hand the use of large gridding factors to reduce the number of nodes will cause stability problems and the excitation of spurious modes will be inevitable. Therefore the thin conducting sheets have to be described by a seperate model enclosed in a TLM mesh modeling the environment.
KeywordsSurface Impedance Skin Effect Triplate Line Spurious Mode Planar Circuit
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- 1.P.B. Johns, R.L. Beurle, “Numerical Solution of 2-Dimensional Scattering Problems using a Transmission-Line Matrix,” Proc. IEE, vol.118, no. 9, pp 1203–1208, Sept. 1971.Google Scholar
- 3.W.J.R. Hoefer, “The Transmission Line Matrix (TLM) Method,” Chapter 8 in “Numerical Techniques for Microwave and Millimeter Wave Passive Structures,” edited by T. Itoh, New York, 1989, John Wiley & Sons, pp. 496-591.Google Scholar
- 4.A.J. Gruodis, C. W. Ho, E. F. Miersch and A.E. Ruehli, “Delay line approach for analyzing lossy transmission lines,” IBM Technical Disclosure Bulletin, Vol.19, pp.2366–2368, 1976.Google Scholar
- 5.P.A. Brennan and A.E. Ruehli, “Time-domain skin-effect using resitors and lossless transmission lines,” IBM Technical Disclosure Bulletin, Vol.21, pp.2362–2363, 1978.Google Scholar
- 9.S. Akhtarzad, “Analysis of Lossy Microstrip Structures and Microstrip Resonators by the TLM Method,” Ph.D dissertation, University of Nottingham, England, July 1975.Google Scholar