Abstract
Ceramic materials are often used in high performance semiconductor devices. Brazing is used as a common technique of joining the metal pins with the ceramic chip carriers. Brazing of thermally dissimilar materials results in high stress/strain gradients in the ceramic material which ultimately leads to the inferior performance of the device. Steep stress gradients and constantly decreasing size of the chips dictate the necessity of measuring the stresses with the spatial resolution of 100 μm or higher. The standard large area diffraction is not suitable for this purpose. The present research is concerned with the residual stress measurement in brazed kovar-alumina joints using x-ray micro-diffraction technique.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
SAE. “Residual Stress Measurement by X-Ray Diffraction, SAE J784a,” SAE Inc., Warrendale, PA (1971).
I.C. Noyan and J.B. Cohen, “Residual Stress Measurement by Diffraction and Interpretation,” Springer-Verlag, New York (1987).
C.O. Ruud, “Position Sensitive Detector Improves X-Ray Powder Diffraction,” Industrial Research and Development: 84 (January 1983).
J.B. Wachtman, Jr., W.E. Teft, D.G. Lam, Jr., and R.P. Stinchfield, “Elastic Constants of Synthetic Single Crystal Corrundum at Room Temperature,” J. Research Natl. Bur. Standards 64A (3):213 (1960).
W. Voigt, Lehrbuch der Kristallphysik, Taubner, Leipzig/Berlin (1928).
A. Reuss, Z. Angew Math. Mech. 9:49 (1929).
Z. Hashin and S. Shtrikman, “A Variational Approach to the Theory of the Elastic Behavior of Polycrystals,” J. Mech. Phys. Solids 10:343 (1962).
F.P. Knudsen, “Effect of Porosity on Young’s Modulus of Alumina,” J. Amer. Cer. Soc. 45(2):94 (1962).
R.W. Rice, “Extension of the Exponential Porosity Dependence of Strength and Elastic Moduli,” J. Amer. Cer. Soc. 59(11–12):536 (1976).
R.W. Rice, “Comparison of Stress Concentration Versus Minimum Solid Area Based Mechanical Property-Porosity Relations,” J. Mat. Science 28(8):2187 (1993).
B.D. Cullity, Elements of X-Ray Diffraction, Addison-Wesley, Reading (1978).
L.D. Dikusar, E.F. Dudarev, and V.E. Panin, “Statistical Theory of the Microdeformations of Polycrystals. I.”, Izv. Vyssh. Zaved., Fizika 8:96 (August 1971).
K.J. Kozaczek, et al., “Microstructural Modeling of Grain Boundary Stresses in Alloy 600,” submitted to J. Mat.Sci.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1994 Springer Science+Business Media New York
About this chapter
Cite this chapter
Kozaczek, K.J., Ruud, C.O., Fitting, J.D. (1994). Measurement of Residual Stresses on Ceramic Materials with High Spatial Resolution. In: Green, R.E., Kozaczek, K.J., Ruud, C.O. (eds) Nondestructive Characterization of Materials VI. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-2574-5_36
Download citation
DOI: https://doi.org/10.1007/978-1-4615-2574-5_36
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-6100-8
Online ISBN: 978-1-4615-2574-5
eBook Packages: Springer Book Archive