Abstract
This chapter provides a descriptive introduction to the philosophy of Macro Test which is the concept at the very heart of this book. A clear understanding of what Macro Test is and the problems that it can solve allows the benefits of using this methodology to be fully appreciated. It is shown that Macro Test concepts need to be integrated into a design system. Some important integration issues, such as clearly described responsibilities, activities, and interfaces are discussed.
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© 1995 Springer Science+Business Media Dordrecht
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Beenker, F.P.M., Bennetts, R.G., Thijssen, A.P. (1995). Macro Test: A Framework for Testable IC Design. In: Testability Concepts for Digital ICs. Frontiers in Electronic Testing, vol 3. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-2365-9_3
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DOI: https://doi.org/10.1007/978-1-4615-2365-9_3
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-6004-9
Online ISBN: 978-1-4615-2365-9
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