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A First Step for Semiconductor Quantum Device Modeling with Incoherent Scattering

Part of the NATO ASI Series book series (NSSB, volume 342)

Abstract

The general form of the Hamiltonian considered here is H = H 0+H pop+H IR where H 0 contains the kinetic energy, the effects of band structure, and the Hartree potential. The two terms to the right represent the potential felt by the electrons due to polar optical phonons and interface roughness, respectively. The scattering terms are included through self-energies. Further, H 0 = H o D * H o L * H o R, which represent the Hamiltonian of the device, the left contact, and the right contact, respectively. The effects of the left and right contacts, H o L * H o R, will also be taken into account through a self energy, ΣUB. The Hamiltonian matrix is written in terms of the basis \( \left \langle r|K,n \right \rangle=e^{ik\cdot r_t}\phi_{i}(z)/\sqrt{A} \) where k is the transverse wave vector, Фi. (z) is a localized (Wannier) function localized around site ‘i’, and ‘A’ is the cross sectional area. Only nearest neighbor matrix elements are retained.

Keywords

Interface Roughness Incoherent Scattering Polar Optical Phonon NATO Advance Study Institute Transverse Wave Vector 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. Fiig, T., and Jauho, A.P., 1992, Surf. Sci.267:392.ADSCrossRefGoogle Scholar
  2. Fisher, D. S., and Lee, P. A., 1981, Phys. Rev. B23:6851.MathSciNetADSCrossRefGoogle Scholar
  3. Hershfield, S., Davies, J. H., and Wilkins, J. W., 1992, Phys. Rev. B46:7046.ADSCrossRefGoogle Scholar
  4. Langreth, D. C., 1976, in “NATO Advanced Study Institute on Linear and Nonlinear Electron Transport in Solids,” Plenum Press, New York, p.3.Google Scholar
  5. Roblin, P., and Liou, W., 1993, Phys. Rev. B40:2416.Google Scholar

Copyright information

© Springer Science+Business Media New York 1995

Authors and Affiliations

  • R. Lake
    • 1
  1. 1.Corporate R&DTexas Instruments, Inc.DallasUSA

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