Current Trends in Si(Li) Detector Windows for Light Element Analysis

  • M. W. Lund

Abstract

Over the last 10 years much of the progress in x-ray spectroscopy has been in the area of light element analysis. In wavelength dispersive spectroscopy, this has resulted from the development of multilayer synthetic crystals. In energy dispersive spectroscopy, this has resulted from the development of new window technologies. Energy dispersive Si(Li) detectors have become more sensitive over the years, until the window can be the limiting factor in light element x-ray analysis. The window allows x-rays to pass and protects the detector from light and gases. It must withstand atmospheric pressure and repeated pressure cycling. Several technologies have been developed for this purpose.(1,2)

Keywords

Magnesium Carbide Lithium Boron Helium 

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Copyright information

© Springer Science+Business Media New York 1995

Authors and Affiliations

  • M. W. Lund
    • 1
  1. 1.MOXTEK, Inc.OremUSA

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