The Development of Energy Dispersive Electron Probe Analysis

  • K. F. J. Heinrich

Abstract

Castaing’s first electron probe microanalyzer(l) was a modified electrostatic transmission electron microscope equipped with a curved-crystal x-ray spectrometer. This combination was perfected in later years by the introduction of Langmuir-Blodgett devices(2) and of diffractors consisting of evaporated metal layers, (3) so that the elements of atomic number above 3 could also be observed and analyzed.

Keywords

Migration Lithium Radium Beryllium Photographic Emulsion 

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References

  1. 1.
    R. Castaing, Doctoral Thesis, University of Paris (1951).Google Scholar
  2. 2.
    I. Langmuir, J. Franklin Inst. 218, 153 (1934).CrossRefGoogle Scholar
  3. 3.
    J. F. Bastin and H. J. M. Heijligers, in: Electron Probe Quantitation (K. F. J. Heinrich and D. E. Newbury, eds.) Plenum Press, NewYork, p. 145 (1991).Google Scholar
  4. 4.
    R. Castaing and J. Descamps, J. Phys. Radium 16, 304 (1955).CrossRefGoogle Scholar
  5. 5.
    S. J. B. Reed and J. V. P. Long, NBS Technical Note 521, National Bureau of Standards, Washington, DC, p. 317 (1970).Google Scholar
  6. 6.
    R. Castaing and J. Descamps, J. Phys. Radium 16, 304 (1955).CrossRefGoogle Scholar
  7. 7.
    R. Castaing and J. Henoc in: Proceedings, Fourth International Congress on X-Ray Optics and Microanalysis (R. Castaing, P. Deschatnp, and J. Philibert, eds.) Hermann, Paris, p. 120 (1966).Google Scholar
  8. 8.
    J. Philibert, in: Proceedings, Third International Conference on X-Ray Optics and Microanalysis (H. H. Pattee, V. E. Cosslett, and A. Engstrom, eds.) Academic Press, New York, p. 379 (1963).Google Scholar
  9. 9.
    K. F. J. Heinrich and D. E. Newbury, eds., Electron Probe Quantitation, Plenum Press, New York (1991).Google Scholar
  10. 10.
    V. E. Cosslet and P. Duncumb, Nature 177, 1172 (1956).CrossRefGoogle Scholar
  11. 11.
    G. F. Bastin and H. J. M. Heijligers, in: Electron Probe Quantitation (K. F. J. Heinrich and D. E. Newbury, eds.) Plenum, New York, p. 163 (1991).Google Scholar
  12. 12.
    C. J. Cooke and P. Duncumb, in: Proceedings, Fifth International Congress on X-Ray Optics and Microanalysis (G. Möllenstedtand and K. H. Gaukler, eds.) Springer, Berlin, p. 245 (1969).Google Scholar
  13. 13.
    K. F. J. Heinrich, Advances in X-Ray Analysis 3, Plenum Press, New York, p. 370 (1960).Google Scholar
  14. 14.
    R. M. Dolby, in: X-Ray Optics and X-Ray Microanalysis (H. H. Pattee, V. E. Cosslett, and A. Engstöm, eds.) Academic Press, New York, p. 483 (1963).Google Scholar
  15. 15.
    R. Fitzgerald, K. Keil, and K. F. J. Heinrich, Science 159, 528 (1968).PubMedCrossRefGoogle Scholar
  16. 16.
    E Duncumb, in: X-Ray Microscopy and Microradiography (V. E. Cosslett, A. Eng-ström, and H. H. Pattee, eds.) Academic Press, New York, p. 617 (1957).Google Scholar
  17. 17.
    K. F. J. Heinrich, Electron Beam X-Ray Microanalysis, Van Nostrand Reinhold, New York, p. 193 (1981).Google Scholar
  18. 18.
    Standard Reference Data Base 36, available from the Office of Standard Reference Data, National Institute of Standards and Technology, Gaithersburg, MD 20899.Google Scholar
  19. 19.
    T. O. Ziebold and R. E. Ogilvie, Anal. Chem. 36, 322 (1964).CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1995

Authors and Affiliations

  • K. F. J. Heinrich
    • 1
  1. 1.National Institue of Standards and Technology (ret.)RockvilleUSA

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