Abstract
The triple-differential cross section of sequential photo double-ionization shows for small relative angle between the emitted electrons and equal or nearly equal electron energies interesting phenomena due to post-collision interaction and electron exchange. The experimental verification needs particularly tailored equipment. We present three examples.
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References
J. S. Briggs and V. Schmidt,J. Phys. B: At. Mol. Opt. Phys.33, R1(2000).
V. Schmidt,X-Ray and Inner-Shell Processes, 2000.
L. Végh and J. H. Macek,Phys. Rev. A 50, 4031(1994).
M. Yu. Kuchiev and S. A. Sheinerman,J. Phys. B: At. Mol. Opt. Phys.27, 2943(1994).
R. O. Barrachina and J. H. Macek,J. Phys. B: At. Mol. Opt Phys.22, 2151(1989).
O. Schwarzkopf and V. Schmidt,J. Phys. B: At. Mol. Opt Phys.29, 3023(1996).
S. J. Schaphorst, A. Jean, O. Schwarzkopf, P. Lablanquie, L. Andric, A. Huetz, J. Maeau and V. Schmidt,J. Phys. B: At Mol. Opt Phys.29, 1901(1996).
J. Viefhaus, G. Snell, R. Hentges, M. Wiedenhöft, F. Heiser, O. Geßner and U. Becker,Phys. Rev. Lett 80, 1618(1998).
P. Selles, J. Mazeau, P. Lablanquie, L. Malegat and A. Huetz,J. Phys. B: At. Mol. Opt Phys.31, L353(1998).
M. Wiedenhöft, A. A. Wills, S. Canton, O. Nayandin, J. Viefhaus and N. Berrah, in18th International Conference on X-Ray and Inner-Shell Processes, book of abstracts, page 177(1999).
S. Rioual, B. Rouvellou, L. Avaldi, G. Battera, R. Camilloni, G. Stefani and G. Turri,Phys. Rev. A 61, 044702(2000).
S. A. Sheinerman and V. Schmidt,J. Phys. B: At. Mol. Opt. Phys.30, 1677(1997).
H. Derenbach, Ch. Franke, R. Malutzki, A. Wachter and V. Schmidt,Nuclear Instruments and Methods in Physics Research A 260, 258(1987).
O. Schwarzkopf and V. Schmidt,J. Phys. B: At. Mol. Opt Phys.28, 2847(1995).
N. Scherer, H. Lörch, T. Kerkau and V. Schmidt,Phys. Rev. Lett.82, 4615(1999).
J. K. Swenson, C. C. Havener, N. Stolterfoht, K. Sommer and F. W. Meyer,Phys. Rev. Lett.63, 35(1989).
S. A. Sheinerman and V. Schmidt,J. Phys. B: At Mol. Opt Phys.32, 5205(1999).
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Scherer, N., Schmidt, V. (2001). Electron-Electron Coincidence Studies in Xenon with Precisely Tailored Equipment. In: Berakdar, J., Kirschner, J. (eds) Many-Particle Spectroscopy of Atoms, Molecules, Clusters, and Surfaces. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-1311-7_12
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DOI: https://doi.org/10.1007/978-1-4615-1311-7_12
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