Electron Energy Loss Spectroscopy Methodology for Boron Localisation in Plant Cell Walls
Electron energy loss spectroscopy (EELS) depends on the phenomenon that when an electron beam interacts with electrons in matter, as in a conventional transmission electron microscope, each beam electron can lose a characteristic amount of its energy. The magnitude of the energy loss depends on which element has been struck by the beam electron, and on which transition occurs between inner-shell atomic orbitals of that element. For a specific element there are one, or sometimes more, characteristic features or ‘edges’ in the EELS spectrum. When there are two distinct EELS edges (e.g. the K and L edges) for an element, these are derived from different orbital transitions. Valence (outer) electrons are not involved in these transitions but the fine structure of the L edges, in particular, contains information derived from minor interactions with the valence electron configuration and hence on the bonding environment of the atom.
KeywordsBackground Subtraction Secondary Cell Wall Electron Energy Loss Spectroscopy Flax Fibre Fibre Cell Wall
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