Surface Modification by Ion Assisted Reaction
Surface characteristics of polymers determine their interfacial properties and technological applications. There have been many attempts to modify the surface of polymers to improve wettability, dye printing and adhesion to other materials. Plasma technology, high energy ion beam irradiation, corona discharge and other techniques have been used. However, rough surface and/or surface damage such as bond scission, carbonization, crosslinking, etc. are produced by the above methods. A coating of a surfactant was found to be relatively successful in enhancing the wettability of polymers, but a lifetime of the surfactant is too short for practical use. Therefore, new surface modification method is demanded to get the polymer surfaces free of the surface damage and having good wettability with a long lifetime. Koh et al 1–3) successfully modified hydrophobic surface of polymers into hydrophilic one by the combination of a low energy ion beam and reactive gas environment, and they named this surface modification method “Ion Assisted Reaction (IAR)”. They also reported that the activated polymer surfaces irradiated by energetic ions induce a chemical reaction with reactive gas, and new formed bonds such as carboxyl, carbonyl, hydroxyl, and ester radicals improve wettability and adhesion to other materials.
KeywordsSurfactant Microwave Carbide Epoxy Carboxyl
Unable to display preview. Download preview PDF.
- 3.S. C. Choi, S. Han, W. K. Choi, H. J. Jung and S. K. Koh, Nucl. Instr. And Meth. B 152, 291 (1999).Google Scholar
- 4.R. P. Livi, Nucl. Instr. And Meth. B 10/11, 545 (1985).Google Scholar
- 8.R. Flitsch, D. Y. Shi, J. Vac. Sci. Technol. A8(3), 2376 (1990).Google Scholar
- 9.C. R. Wie, C. R. Shi, M. H. Mendenshall, R. P. Livi, T. Vreeland, T. A. Tombrello, Nucl. Instr. And Meth. B9, 20 (1985).Google Scholar
- 16.G. A. Hishmeh, T. L. Bar, A. Sklyarov, and S. Hardcastle, J. Vac. Sci. Technol., A13, 1330 (1996).Google Scholar
- 17.R. Michael and D. Stulik, J. Vac. Sci. Technol., A4, 1861 (1986).Google Scholar
- 19.E. H. Adem, S. J. Bean, C. M. Demanet, A. Le Moel, and C. M. Duraud, Nucl. Instrum. Meth., B32, 182 (1988).Google Scholar
- 20.L. Torrisi and R. Percolla, Nucl. Instrum. Meth., B117, 387 (1996).Google Scholar
- 21.L. Torrisi, G. Ciavola, R. Percolla, and F. Benyaich, Nucl. Instrum. Meth., B116, 473 (1996).Google Scholar
- 22.L. Torrisi, G. Ciavola, G. Foti and R. Percolla, Nucl. Instrum. Meth., A382, 361 (1996).Google Scholar
- 24.B. M. Callen, M. L. Ridge, S. Lahooti, A. W. Neumann, and R. N. S. Sohdi, J. Vac. Sci. Technol., A13, 2023 (1995).Google Scholar