Abstract
Carbon nanotubes possess various superior properties for use as field emitters, such as sharp tips with a nanometer-scale radius of curvature [1], high mechanical stiffness [2–4], high chemical stability [5], and unique electrical properties [6, 7]. Due to the unique tip geometry of the carbon nanotubes, their field emission property is one of the most attractive application [8], which has been extensively studied using the classical technique. In this chapter, we introduce a few novel applications of TEM in characterizing the field emission properties of carbon nanotubes, with a focus on the characteristics of individual carbon nanotubes.
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Wang, Z.L. (2003). In-Situ Field Emission of Carbon Nanotubes. In: Wang, Z.L., Hui, C. (eds) Electron Microscopy of Nanotubes. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-0315-6_8
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DOI: https://doi.org/10.1007/978-1-4615-0315-6_8
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