X-ray Structure Determination with Powders

  • Mark Ladd
  • Rex Palmer


Since the earlier editions of this book, developments have taken place with the x-ray examination of polycrystalline materials that have led to complete structure determinations of medium-sized molecules, with up to 60 atoms in the asymmetric unit. It is appropriate, therefore, to include a short account of this topic in the present edition. Further, more detailed discussions of powder methods can be found in the literature.a,b,c


Rietveld Refinement Powder Pattern Powder Diffraction Data Profile Refinement Framework Topology 
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  1. David, W. I. F., Shankland, K., McCusker, L. B., and Baerlocher, Ch. (Editors), Structure Determination from Powder Diffraction Data, International Union of Crystallography/Oxford University Press, Oxford (2002).Google Scholar
  2. Peschar, R., Molecular Structure Solution Procedures, 3, 59 (1990).Google Scholar
  3. Prince, E., Structure and Statistics in Crystallography (Edited, A. J. C. Wilson) Adenine Press (1985).Google Scholar
  4. Schenk, H., Computational Crystallography (Edited, D. Sayre) Oxford University Press (1982).Google Scholar
  5. Young, R. A., The Rietveld Method, International Union of Crystallography/Oxford University Press (1993).Google Scholar

Copyright information

© Springer Science+Business Media New York 2003

Authors and Affiliations

  • Mark Ladd
    • 1
  • Rex Palmer
    • 2
  1. 1.Department of ChemistryUniversity of SurreyGuildfordEngland
  2. 2.Department of CrystallographyBirkbeck College, University of LondonLondonEngland

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