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The Technique for Evaluating the Immunity of Digital Devices to the Influence of Ultrawideband Electromagnetic Pulses

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Abstract

The procedure for evaluating the immunity of digital devices to the influence of repetitive ultrawideband electromagnetic pulses is proposed. This procedure makes it possible to choose the optimal characteristics of radiated pulses, to estimate the effects of error-performance degradation and to predict the results of influence of pulses with arbitrary parameters, etc.

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References

  1. Parfenov, Yu., Titov, B., Zdoukhov, L.: Technique of estimating probability of upsets in digital devices at influence of supershort electromagnetic impulses. The Russian Academy of Sciences, Magazine of Radioelectronics, No. 5 (May 2011)

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  4. Parfenov, Yu., Kohlberg, I., Radasky, W., Titov, B., Zdoukhov, L.: The probabilistic analysis of immunity of the data transmission channel to influence of periodically repeating voltage pulses. In: Asia-Pacific EMC Week and Technical Exhibition, Singapore, 19–23 May 2008

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Correspondence to Yury V. Parfenov .

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© 2014 Springer Science+Business Media New York

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Parfenov, Y.V., Titov, B.A., Zdoukhov, L.N. (2014). The Technique for Evaluating the Immunity of Digital Devices to the Influence of Ultrawideband Electromagnetic Pulses. In: Sabath, F., Mokole, E. (eds) Ultra-Wideband, Short-Pulse Electromagnetics 10. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-9500-0_28

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  • DOI: https://doi.org/10.1007/978-1-4614-9500-0_28

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  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4614-9499-7

  • Online ISBN: 978-1-4614-9500-0

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