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Introduction

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RHEED Transmission Mode and Pole Figures

Abstract

In this introduction, a short historical background of electron diffraction, especially reflection high-energy electron diffraction (RHEED) and its major applications in molecular beam epitaxy (MBE) growth, is briefly discussed. Then the early work on texture films using RHEED transmission mode and the recent development of RHEED pole figure analysis for textured films are introduced. The importance of the finite inelastic mean free path (IMFP) of electrons in RHEED is emphasized.

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References

  • Bauer, E.: Low energy electron microscopy. Rep. Prog. Phys. 57(9), 895–938 (1994)

    Article  Google Scholar 

  • Braun, W.: Applied RHEED: reflection high-energy electron diffraction during crystal growth (Springer tracts in modern physics). Springer, Heidelberg (1999)

    Google Scholar 

  • Davisson, C., Germer, L.: Diffraction of electrons by a crystal of nickel. Phys. Rev. 30, 705–740 (1927)

    Article  Google Scholar 

  • Dobson, P. J., Joyce, B. A., Neave, J. H.: Current understanding and applications of the RHEED intensity oscillation technique. J. Cryst. Growth. 81, 1–8 (1987)

    Article  Google Scholar 

  • Gehrenbeck, R. K.: Electron diffraction: fifty years ago. Physics Today, p 34 (January 1978)

    Google Scholar 

  • Gries, W. H.: A universal predictive equation for the inelastic mean free path lengths of x-ray photoelectrons and Auger electrons. Surf. Interface Anal. 24, 38–50 (1996)

    Article  Google Scholar 

  • Harris, J. J., Joyce, B. A., Dobson, P. J.: Oscillation in the surface structure of Sn-doped GaAs during growth by MBE. Surf. Sci. 103(1), L90–L96 (1981)

    Article  Google Scholar 

  • Horn, M., Gotter U., Henzler, M.: Low energy electron diffraction investigation of Si molecular-beam epitaxy onto Si(100). J. Vac. Sci. Technol. B 6(2), 727–730 (1988)

    Article  Google Scholar 

  • Ichimiya, A., Cohen, P. I.: Reflection high-energy electron diffraction. Cambridge University Press, New York (2004)

    Book  Google Scholar 

  • Larsen, P. K., Dobson, P. J.: Reflection high-energy electron diffraction and reflection electron imaging of surfaces. NATO Science Series B: Physics, vol. 188, Plenum Press, New York (1988)

    Google Scholar 

  • Lu, T.-M., Wang, G.-C., Zhao, Y.-P.: Beyond intensity oscillations. Surf. Rev. Lett. 5 (3 and 4), 899–912 (1998)

    Article  Google Scholar 

  • Powell, C. J., Jablonski, A.: Evaluation of calculated and measured electron inelastic mean free paths near solid surfaces. J. Phys. Chem. Ref. Data. 28, 19–62 (1999)

    Google Scholar 

  • Powell, C. J., Jablonski A.: Evaluation of electron inelastic mean free paths for selected elements and compounds. Surf. Interface Anal. 29, 208–214 (2000)

    Article  Google Scholar 

  • Powell, C. J., Jablonski, A.: NIST Electron Inelastic-Mean-Free-Path Database-Version 1.2. National Institute of Standards and Technology, Gaithersburg, MD (2010)

    Google Scholar 

  • Tang, F., Wang, G.-C., Lu, T.-M.: Surface pole figures by reflection high-energy electron diffraction. Appl. Phys. Lett. 89, 241903–3 (2006)

    Article  Google Scholar 

  • Tang, F., Parker, T., Wang, G.-C., Lu, T.-M.: Surface texture evolution of polycrystalline and nanostructured films: RHEED surface pole figure analysis. J. Phys. D: Appl. Phys. 40, R427–R439 (2007)

    Article  Google Scholar 

  • Tanuma, S., Powell, C. J., Penn, D. R.: Calculations of electron mean free path. V. Data for 14 organic compounds over the 50–2000 eV range. Surf. Interface Anal. 21, 165–176 (1994)

    Article  Google Scholar 

  • Tanuma, S., Powell, C. J., Penn, D. R.: Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range. Surf. Interface Anal. 43, 689–713 (2011)

    Article  Google Scholar 

  • Tromp, R. M., Hannon, J. B., Ellis, A. W., Wan, W., Berghaus, A., Schaff, O.: A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design. Ultramicroscopy, 110(7), 852–861 (2010)

    Article  Google Scholar 

  • Wang, Z. L.: Reflection electron microscopy and spectroscopy for surface analysis. Cambridge University Press, New York (1996)

    Book  Google Scholar 

  • Yang, H.-N., Wang, G.-C., Lu, T.-M.: Quantitative study of the decay of intensity oscillation in transient layer-by-layer growth. Phys. Rev. B 51, 17932–17945 (1995)

    Article  Google Scholar 

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Authors and Affiliations

  1. Dept of Phys., Applied Phys., and Astro., Rensselaer Polytechnic Institute, Troy, New York, USA

    Gwo-Ching Wang

  2. Dept. of Phys., Applied Phys., and Astro, Rensselaer Polytechnic Institute, Troy, New York, USA

    Toh-Ming Lu

Authors
  1. Gwo-Ching Wang
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  2. Toh-Ming Lu
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Correspondence to Gwo-Ching Wang .

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Wang, GC., Lu, TM. (2014). Introduction. In: RHEED Transmission Mode and Pole Figures. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-9287-0_1

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  • DOI: https://doi.org/10.1007/978-1-4614-9287-0_1

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  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4614-9286-3

  • Online ISBN: 978-1-4614-9287-0

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