# Power and Yield for SRAM Memory

Chapter

First Online:

## Abstract

As noted in the previous chapter, supply voltage, cell ratio, and threshold voltage of the devices are the factors that determine whether a cell is robust and stable. In addition to these factors, controlling variability through process technology further reduces the device parameter shift. The SRAM cell stability and its effect on both yield and power have been addressed through several techniques, and they are as follows:

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