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Ion–Solid Interactions and Image Formation

  • David C. Joy
Chapter
Part of the SpringerBriefs in Materials book series (BRIEFSMATERIALS)

Abstract

Both electron and ion beams can be used to provide a number of different modes of imaging and microanalysis In every case, and in order to properly optimize and interpret the data generated by the instrument, it is necessary to know something about what kinds of beam interactions are involved, what information may be obtained from each, and how the signal yields and spatial resolution can be optimized in each case. Images whose origins are neither known nor understood can never be any more than just a pretty picture.

Keywords

Beam Energy Secondary Electron Interaction Volume Detector Quantum Efficiency Incident Beam Energy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© David Joy 2013

Authors and Affiliations

  1. 1.University of TennesseeKnoxvilleUSA

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