Abstract
We studied the effect of Bi incorporation on the carrier mobilities and electron effective mass in the dilute Bismide alloy, GaAs1 − x Bi x , using electrical transport and photoluminescence techniques. We observed no significant degradation in the electron Hall mobility with Bi incorporation in GaAs, up to a concentration of 1.2 %. At higher Bi concentration (≥1.6 %) some degradation of the electron mobility was observed, although there is no apparent trend. Our measurements show that the hole Hall mobility decreases with increasing Bi concentration. Analysis of the temperature-dependent Hall transport data of p-type GaAs1 − x Bi x epilayers along with low-temperature PL measurements of p-doped and undoped epilayers suggests that Bi incorporation results in the formation of several trap levels above the valence band which we attribute to Bi–Bi pair states. The decrease in hole mobility with increasing Bi concentration can be explained as being caused by scattering at the isolated Bi and the Bi–Bi pair states. Magnetic field- and temperature-dependent resistivity measurements on n-type GaAs1 − x Bi x showed clear Shubnikov de Haas (SdH) oscillations up to a concentration of 0.88 %. The measured electron effective mass exhibits a gradual increase up to a concentration of 0.4 % Bi and then a gradual decrease. Accounting for the giant bandgap and spin-orbit bowing, the measured changes in the effective mass are in qualitative agreement with perturbation theory applied to these band changes, confirming that Bi mainly perturbs the valence band.
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Acknowledgements
This work was supported by the DOE/SC/BES/DMS under contract no. DE-AC36-08GO28308 with the National Renewable Energy Laboratory.
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Kini, R.N., Mascarenhas, A. (2013). Effect of Bismuth Alloying on the Transport Properties of the Dilute Bismide Alloy, GaAs1 − x Bi x . In: Li, H., Wang, Z. (eds) Bismuth-Containing Compounds. Springer Series in Materials Science, vol 186. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-8121-8_8
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