Introduction

Chapter
Part of the Analog Circuits and Signal Processing book series (ACSP)

Abstract

This work aims to provide the reader with a comprehensive understanding on the subject of modeling, analyzing and understanding the impact of transistor aging on analog integrated circuits (IC) in a nanometer complementary metal-oxide-semiconductor (CMOS) technology. The first chapter of this work introduces the problem studied and the major subjects addressed in this book.

Keywords

Europe Radar Assure Fermat Active Element 

Copyright information

© Springer Science+Business Media New York 2013

Authors and Affiliations

  1. 1.ESAT-MICASKU LeuvenHeverleeBelgium

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