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Introduction

  • Elie Maricau
  • Georges Gielen
Chapter
Part of the Analog Circuits and Signal Processing book series (ACSP)

Abstract

This work aims to provide the reader with a comprehensive understanding on the subject of modeling, analyzing and understanding the impact of transistor aging on analog integrated circuits (IC) in a nanometer complementary metal-oxide-semiconductor (CMOS) technology. The first chapter of this work introduces the problem studied and the major subjects addressed in this book.

Keywords

Reliability Engineering Accelerate Life Test Integrate Circuit Negative Bias Temperature Instability Failure Mode Effect Analysis 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© Springer Science+Business Media New York 2013

Authors and Affiliations

  1. 1.ESAT-MICASKU LeuvenHeverleeBelgium

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