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Cross-Layer Design in Optical Networks pp 243–262Cite as

Cross-Layer Survivability

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Part of the book series: Optical Networks ((OPNW,volume 15))

Abstract

The layered architecture of modern communication networks takes advantage of the flexibility of upper layer technology, such as IP, and the high data rates of lower layer technology, such as WDM. In particular, the WDM technology available today can support up to several terabits per second over a single fiber [9], making networks vulnerable to failures, because a failure for even a short period of time can result in a huge loss of data. The main theme of network survivability is to prevent such data loss by provisioning spare resources for recovery. In this chapter, we focus on the impact of layering on network survivability.

Based on “Cross-Layer Survivability in WDM-based Networks,” by K. Lee, E. Modiano and H. Lee which appeared in IEEE/ACM Transactions on Networking, vol. 19, no. 4, Aug. 2011, and “Reliability in Layered Networks with Random Link Failures,” by K. Lee, H. Lee and E. Modiano which appeared in IEEE INFOCOM 2010, Mar. 2010.c 2011 IEEE.

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Notes

  1. 1.

    Although computing the MCLC is NP-Hard [14], for practical purposes, the MCLC of a network is typically upper bounded by some constant, such as the minimum node degree of the logical network.

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Acknowledgements

This work was supported by NSF grants CNS-0626781 and CNS-0830961 and by DTRA grants HDTRA1-07-1-0004 and HDTRA-09-1-0050. Hyang-Won Lee was supported in part by the Basic Science Research Program through the National Research Foundation of Korea(NRF) funded by the Ministry of Education, Science and Technology (2012R1A1A1012610).

Author information

Authors and Affiliations

  1. Konkuk University, Seoul, 143-701, Republic of Korea

    Hyang-Won Lee

  2. Google Inc, Cambridge, MA, USA

    Kayi Lee

  3. Massachusetts Institute of Technology, Laboratory for Information and Decision Systems, 77 Mass Ave, Cambridge, MA, 02139, USA

    Eytan Modiano

Authors
  1. Hyang-Won Lee
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  2. Kayi Lee
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  3. Eytan Modiano
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Corresponding author

Correspondence to Hyang-Won Lee .

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Editors and Affiliations

  1. Dept. Electrical Engineering &, Computer Science, George Washington University, 22nd St. NW 801, Washington, 20052, District of Columbia, USA

    Suresh Subramaniam

  2. , Department of Electrical and Computer En, University of Virginia, 351 McCormick Road, Charlottesville, 22904, Virginia, USA

    Maïté Brandt-Pearce

  3. Gebroeders Desmetstraat 1, Ghent, 9000, Belgium

    Piet Demeester

  4. , Networks and Services Department, Create-Net, Povo-Trento, 38123, Italy

    Chava Vijaya Saradhi

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Lee, HW., Lee, K., Modiano, E. (2013). Cross-Layer Survivability. In: Subramaniam, S., Brandt-Pearce, M., Demeester, P., Vijaya Saradhi, C. (eds) Cross-Layer Design in Optical Networks. Optical Networks, vol 15. Springer, Boston, MA. https://doi.org/10.1007/978-1-4614-5671-1_12

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  • DOI: https://doi.org/10.1007/978-1-4614-5671-1_12

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  • Online ISBN: 978-1-4614-5671-1

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