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Part Risk Assessment and Mitigation

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Optimum Cooling of Data Centers

Abstract

Some of the efficient cooling methods, such as free air cooling, extend the operating environment of telecom equipment, which may impact the performance of electronic parts. Parts located at hotspots may not function as required or may have unacceptable parameter variations resulting in inadequate performance. This chapter introduces the background information and methods necessary to identify the parts at risk.

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Notes

  1. 1.

    Not all datasheets are public. A part may be built for a specific application and the datasheet for this part may be a proprietary internal document.

  2. 2.

    Some EIA/JEDEC documents refer to absolute maximum ratings as absolute maximum “continuous” ratings. In those documents, transient conditions under which these ratings may be exceeded are defined.

  3. 3.

    Some manufacturers, such as Philips and Freescale, provide supplementary information on how to estimate power dissipation for some of their parts and part families.

  4. 4.

    Parts usually go through reflow soldering where the whole package is exposed to radiative and/or convective heat. The lead temperature and exposure time limit together provide a safeguard so that the package and the circuitry are not damaged by exposure to high temperatures. For insertion-mount parts, which are usually wave soldered, the part bodies are not exposed to direct heat, and this rating has generally not been considered essential.

  5. 5.

    The mounting torque of a screw-mounted device determines the quality of thermal contact between the part and the board. Thus, mounting torque impacts the heat flow from a part to the board.

  6. 6.

    The junction temperature limit specified in the absolute maximum ratings of the part datasheet cannot be used as an uprating parameter because reliability is not guaranteed.

References

  1. H. Kanter, R. Atta, Integrating Defense into the Civilian Technology and Industrial Base, Office of the Assistant Secretary of Defense for Production and Logistics, Feb. 1993

    Google Scholar 

  2. IEC Standard 747-1, Semiconductor Devices—Discrete Devices and Integrated Circuits, Geneva, Switzerland, 1983

    Google Scholar 

  3. IEC Standard 60134, Ratings System for Electronic Tubes and Valves and Analogous Semiconductor Devices, Geneva, Switzerland, 1961 (Last review date 1994)

    Google Scholar 

  4. R. Locher, Introduction to Power MOSFETs and their Applications, National Semiconductor Application Note, vol. 558, Santa Clara, CA, Dec. 1988

    Google Scholar 

  5. Philips, Family Specifications: HCMOS Family Characteristics, Mar. 1988

    Google Scholar 

  6. Harris Semiconductor, Datasheet of CD54HC00, Melbourne, Florida, 1997

    Google Scholar 

  7. AMD, Datasheet of AM486DE2, Sunnyvale, CA, Apr. 1996

    Google Scholar 

  8. SEMATECH, SEMATECH Official Dictionary Rev 5.0, Technology Transfer 91010441C-STD, http://www.sematech.org/public/publications/dict/images/dictionary.pdf, 1995, as of Aug. 2002

  9. Intel Application Note AP-480–Pentium® Processor Thermal Design Guidelines Rev 2.0, Nov. 1995

    Google Scholar 

  10. Intel, Packaging Data Book, Denver, CO, Jan. 1999

    Google Scholar 

  11. EIA 583, Packaging Material Standards for Moisture Sensitive Parts, Alexandria, VA, 1991

    Google Scholar 

  12. P. McCluskey, R. Munamarty, M. Pecht, Popcorning in PBGA packages during IR reflow soldering. Microelectron. Int. 42, 20–23 (1997)

    Article  Google Scholar 

  13. United States Department of Defense, Mil-Std-883: Test Method Standards—Microcircuits, 1996

    Google Scholar 

  14. EIA/JEDEC Standard EIA/JESD51, Methodology for the Thermal Measurement of Component Packages (Single Semiconductor Device), Alexandria, VA, Dec. 1995

    Google Scholar 

  15. AMD, Packaging Handbook—Chapter 8: Performance Characteristics of IC Packages, Sunnyvale, CA, 1998

    Google Scholar 

  16. V. Dutta, Junction-to-case thermal resistance—still a myth? in Proceedings of the 4th IEEE SEMI-THERM Symposium, pp. 8-11 (1988)

    Google Scholar 

  17. E.A. Wood, Obsolescence Solutions for 5 Volt Integrated Circuits Beyond 2005, in Proceedings of Commercialization of Military and Space Electronics, pp. 393-405, Los Angeles, CA, January 30–February 2, 2000

    Google Scholar 

  18. EIA Standard RS-419-A, Standard List of Values to Be Used in Semiconductor Device Specifications and Registration Formats, Alexandria, VA, Oct. 1980

    Google Scholar 

  19. L. Condra, R. Hoad, D. Humphrey, T. Brennom, J. Fink, J. Heebink, C. Wilkinson, D. Marlborough, D. Das, N. Pendsé, M. Pecht, Terminology for use of electronic parts outside the manufacturer’s specified temperature ranges. IEEE Trans. Compon. Packag. Technol 22(3), 355–356 (1999)

    Google Scholar 

  20. N. Pendsé, M. Pecht, Parameter Re-characterization Case Study: Electrical Performance Comparison of the Military and Commercial Versions of All Octal Buffer, Future Circuits International, vol. 6 (Technology Publishing Ltd, London, 2000), pp. 63–67

    Google Scholar 

  21. D. Das, N. Pendsé, C. Wilkinson, M. Pecht, Parameter recharacterization: a method of thermal uprating. IEEE Trans. Compon. Packag. Technol. 24(4), 729–737 (2001)

    Article  Google Scholar 

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Correspondence to Jun Dai .

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Dai, J., Ohadi, M.M., Das, D., Pecht, M.G. (2014). Part Risk Assessment and Mitigation. In: Optimum Cooling of Data Centers. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-5602-5_6

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  • DOI: https://doi.org/10.1007/978-1-4614-5602-5_6

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