Abstract
In this chapter the implementation details and the measurement results from a two-stage latch PUF are described. The PUF compares the currents through two mismatching transistors. This is done in two phases to minimize the effect of noise. The implementation was carried out in a 90 nm technology.
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© 2013 Springer Science+Business Media New York
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Böhm, C., Hofer, M. (2013). Two Stage PUF. In: Physical Unclonable Functions in Theory and Practice. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-5040-5_12
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DOI: https://doi.org/10.1007/978-1-4614-5040-5_12
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Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4614-5039-9
Online ISBN: 978-1-4614-5040-5
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