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Towards Improving the Statscan™ X-Ray Image Quality through Sliding-Mode Control of the C-Arm

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Innovations and Advances in Computer, Information, Systems Sciences, and Engineering

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 152))

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Abstract

A method to improve image quality of the Statscan™ X-ray system is investigated. Transient errors in the trapezoidal motion profile of the scanning C-arm may cause mismatches between the detector and collimated beams from the X-ray source. This results in the partial degradation of image quality. The performances of two C-arm motion controllers were investigated using computer simulations and experiments: a standard PI and DMRISMC. The controllers are competitive at high sampling rate. However, the DMRISMC controller shows better performance motion profile tracking when slow sampling rate is used. There are strengths and weaknesses for both controllers and DMRISMC was expected to improve the image quality.

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Acknowledgments

We would like to thank Lodox Systems and the University of Cape Town (UCT) for their financial support.

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Authors and Affiliations

  1. Department of Human Biology, University of Cape Town Private Bag, Rondebosch, 7701, South Africa

    M. Esmail & L. John

  2. Department of Electrical Engineering, University of Cape Town Private Bag, Rondebosch, 7701, South Africa

    M. Tsoeu

Authors
  1. M. Esmail
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  2. M. Tsoeu
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  3. L. John
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Corresponding author

Correspondence to M. Esmail .

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Editors and Affiliations

  1. School of Engineering, University of Bridgeport, University Avenue 221, Bridgeport, 06604, Connecticut, USA

    Khaled Elleithy

  2. School of Engineering, University of Bridgeport, University Avenue 221, Bridgeport, 06604, Connecticut, USA

    Tarek Sobh

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Esmail, M., Tsoeu, M., John, L. (2013). Towards Improving the Statscan™ X-Ray Image Quality through Sliding-Mode Control of the C-Arm. In: Elleithy, K., Sobh, T. (eds) Innovations and Advances in Computer, Information, Systems Sciences, and Engineering. Lecture Notes in Electrical Engineering, vol 152. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-3535-8_72

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  • DOI: https://doi.org/10.1007/978-1-4614-3535-8_72

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  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4614-3534-1

  • Online ISBN: 978-1-4614-3535-8

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