Exponent has produced numerous publications on the topic of cell internal faults, including: Godithi R, Mikolajczak C, Harmon J, Wu M, “Lithium-ion cell screening: Nondestructive and destructive physical examination,” NASA Aerospace Workshop, Huntsville, AL, November 2009.
Mikolajczak C, Harmon J, Wu M, “Lithium plating in commercial lithium-ion cells: Observations and analysis of causes,” Proceedings, Batteries 2009 the International Power Supply Conference and Exhibition, French Riviera, September 30–October 2, 2009.
Hayes T, Mikolajczak C, Megerle M, Wu M, Gupta S, Halleck P, “Use of CT scanning for defect detection in lithium-ion batteries,” Proceedings, 26th International Battery Seminar & Exhibit for Primary & Secondary Batteries, Small Fuel Cells, and Other Technologies, Ft. Lauderdale, FL, March 16–19, 2009.
Horn QC, “Battery involvement in fires: cause or effect?” Invited seminar, International Association of Arson Investigators—Massachusetts Chapter, Auburn, MA, March 19, 2009.
Horn QC, White KC, “Characterizing performance and determining reliability for batteries in medical device applications,” ASM Materials and Processes for Medical Devices, Minneapolis, MN, August 13, 2009.
Horn QC, White KC, “Advances in characterization techniques for understanding degradation and failure modes in lithium-ion cells: Imaging of internal microshorts,” Invited presentation, International Meeting on Lithium Batteries 14, Tianjin, China, June 27, 2008.
Hayes T, Horn QC, “Methodologies of identifying root cause of failures in lithium-ion battery packs,” Invited presentation, 24th International Battery Seminar and Exhibit, Ft. Lauderdale, FL, March 2007.
Loud JD, Hu X, “Failure analysis methodology for Lithium-ion incidents,” Proceedings, 33rd International Symposium for Testing and Failure Analysis, pp. 242–251, San Jose, CA, November 6–7, 2007.
Mikolajczak CJ, Hayes T, Megerle MV, Wu M, “A scientific methodology for investigation of a lithium-ion battery failure,” IEEE Portable 2007 International Conference on Portable Information Devices, IEEE No. 1-4244-1039-8/07, Orlando, FL, March 2007.