High Resolution ExitWave Restoration

Part of the Nanostructure Science and Technology book series (NST)


We review the use of restoration methods that recover the complex specimen exit wave from a suitably conditioned data set of high resolution transmission electron microscope images. Various levels of theory underlying the post-acquisition processing required are described together with the requirements for aberration measurement.


Attenuation Tungsten Coherence GaAs Convolution 


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Copyright information

© Springer Science+Business Media, LLC 2012

Authors and Affiliations

  1. 1.Department of MaterialsOxfordUK
  2. 2.University of Manchester Materials Science CentreManchesterUK
  3. 3.Department of MaterialsUniversity of OxfordOxfordUK

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