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A New Naïve Style Possibilistic Network Classifier

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Measuring Technology and Mechatronics Automation in Electrical Engineering

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 135))

Abstract

This paper proposes a new approach of classification under the possibilistic network (PN) framework with Tree Augmented Naïve Bayes Network classifier (TAN), which combines the advantages of both PN and TAN. The classifier is built from a training set where instances can be expressed by imperfect attributes and classes. A new operator, the possibilistic mean is designed to estimate the conditional possibility distributions of each attribute with imperfection, and the weight between two attributes given the class is determined by the conditioning specificity gain. Experiment has shown the efficiency of the new classifier in imperfect cases.

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Acknowledgments

This work was supported by Doctor Subject Foundation of Heibei University of Science and Technology under Grant No. QD201051 and Scientific Research Plan of Hebei Education Department under Grant No. ZH2011243.

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Correspondence to Jianli Zhao .

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Zhao, J., Liu, J., Sun, Z., Zhao, Y. (2012). A New Naïve Style Possibilistic Network Classifier. In: Hou, Z. (eds) Measuring Technology and Mechatronics Automation in Electrical Engineering. Lecture Notes in Electrical Engineering, vol 135. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-2185-6_10

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  • DOI: https://doi.org/10.1007/978-1-4614-2185-6_10

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  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4614-2184-9

  • Online ISBN: 978-1-4614-2185-6

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