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Synchronized Generation of Directed Tests

  • Mingsong Chen
  • Xiaoke Qin
  • Heon-Mo Koo
  • Prabhat Mishra
Chapter

Abstract

Existing directed test generation techniques have explored two directions to accelerate the SAT solving process: learning during solving of one property with different bounds, or solving multiple properties with known bounds. This chapter combines the advantages of both approaches by introducing a novel SAT-solving technique which exploits the similarities among SAT instances for multiple properties and bounds on the same design. The proposed technique ensures that the knowledge obtained in previous solving iterations be shared across different bounds as well as between different properties

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Copyright information

© Springer Science+Business Media New York 2013

Authors and Affiliations

  • Mingsong Chen
    • 1
  • Xiaoke Qin
    • 2
  • Heon-Mo Koo
    • 3
  • Prabhat Mishra
    • 2
  1. 1.Software Engineering InstituteEast China Normal UniversityShanghaiPeople’s Republic of China
  2. 2.Department of Computer and Information Science and EngineeringUniversity of FloridaGainsvilleUSA
  3. 3.Intel corporationSantaUSA

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