Directed Test Generation for Multicore Architectures

  • Mingsong Chen
  • Xiaoke Qin
  • Heon-Mo Koo
  • Prabhat Mishra


Existing directed test generation approaches focus on knowledge forwarding between different bounds to reduce the test generation time. This chapter describes a test generation technique for multicore architectures that exploits the structural similarity within the same bound as well as between different bounds. It enables the reuse of the knowledge learned from one core to the remaining cores in multicore architectures. The experimental results demonstrate that this approach can significantly reduce overall test generation time compared to existing approaches.


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Copyright information

© Springer Science+Business Media New York 2013

Authors and Affiliations

  • Mingsong Chen
    • 1
  • Xiaoke Qin
    • 2
  • Heon-Mo Koo
    • 3
  • Prabhat Mishra
    • 2
  1. 1.Software Engineering InstituteEast China Normal UniversityShanghaiPeople’s Republic of China
  2. 2.Department of Computer and Information Science and EngineeringUniversity of FloridaGainsvilleUSA
  3. 3.Intel corporationSantaUSA

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