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Digital Image Forensics pp 179–218Cite as

Sensor Defects in Digital Image Forensic

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Abstract

Just as human fingerprints or skin blemishes can be used for forensic purposes, imperfections of digital imaging sensors can serve as unique identifiers in numerous forensic applications, such as matching an image to a specific camera, revealing malicious image manipulation and processing, and determining an approximate age of a digital photograph. There exist several different types of defects that are of interest to the forensic analysts caused by imperfections in manufacturing, physical processes occurring inside the camera, and by environmental factors. This chapter begins with analyzing the pixel defects, while pointing out their forensic potential. Then, specific problems are formulated as tasks involving detection or matching of defects and noise patterns. Practical algorithms for these tasks are developed within the framework of parameter estimation and signal detection theory. The performance of the algorithms is demonstrated in real world examples.

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Notes

  1. 1.

    Equation (43) holds independently of whether or not \({\mathbf{ I} }\) was used by Eve.

  2. 2.

    Temporal ordering of digital images was for the first time considered in [42].

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Acknowledgments

The work on this chapter was partially supported by the NSF grant number CNF-0830528. The U.S. Government is authorized to reproduce and distribute reprints for Governmental purposes notwithstanding any copyright notation there on. The views and conclusions contained herein are those of the authors and should not be interpreted as necessarily representing the official policies, either expressed or implied, of Air Force Office of Scientific Research or the U.S. Government. The author would like to thank Miroslav Goljan for useful discussions.

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Authors and Affiliations

  1. T. J. Watson School of Applied Science and Engineering, SUNY Binghamton, Binghamton, NY, 13902-6000, USA

    Jessica Fridrich

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  1. Jessica Fridrich
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Correspondence to Jessica Fridrich .

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  1. , Computer Engineering Department, TOBB University of Economics and Technol, Sogutozu Cad. 43, Ankara, 06560, Turkey

    Husrev Taha Sencar

  2. Dept. Computer & Information Science, Polytechnic University, Brooklyn, 11201, New York, USA

    Nasir Memon

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Fridrich, J. (2013). Sensor Defects in Digital Image Forensic. In: Sencar, H., Memon, N. (eds) Digital Image Forensics. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-0757-7_6

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  • DOI: https://doi.org/10.1007/978-1-4614-0757-7_6

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