On-Line Testing and Test Generation

  • Yang Zhao
  • Krishnendu Chakrabarty


In this chapter, we present on-line testing and test-generation techniques for digital microfluidic biochips. First we present an on-line testing method for digital microfluidic biochips. This method interleaves the implementation of the microfluidic compactor with bioassays in functional mode. An optimization method is presented to schedule logic AND operations in the compactor to minimize the end time for the compaction procedure. Next we present an automatic test pattern generation (ATPG) method for non-regular digital microfluidic chips. The ATPG method can generate test patterns to detect catastrophic defects in non-regular arrays where the full reconfigurability of the digital microfluidic platform is not utilized.


Clock Cycle Output Port Test Pattern Testing Step Integer Linear Programming Model 
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Copyright information

© Springer Science+Business Media New York 2013

Authors and Affiliations

  1. 1.Advanced Micro DevicesNashuaUSA
  2. 2.Duke University ECEDurhamUSA

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