Advances in the Measurement of Surfaces Properties Utilizing Illumination at Angles Beyond Total Reflection

  • Sciammarella C. A. 
  • Sciammarella F. M. 
  • Lamberti L 
Conference paper
Part of the Conference Proceedings of the Society for Experimental Mechanics Series book series (CPSEMS)

Abstract

In preceding papers the authors have employed evanescent illumination to perform measurement of depth information on rough surfaces. In the developments presented in this paper new experimental evidence has been gathered. This information provides additional elements that help to formulate a more complete model of the phenomena taking place. The carried out measurements when confronted with independently gather information support the formulated model.

Keywords

evanescent waves surface roughness high accuracy topography 

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Copyright information

© Springer Science+Businees Media, LLC 2011

Authors and Affiliations

  • Sciammarella C. A. 
    • 1
  • Sciammarella F. M. 
    • 1
  • Lamberti L 
    • 2
  1. 1.Department of Mechanical EngineeringCollege of Engineering & Engineering Technology Northern Illinois UniversityDeKalbUSA
  2. 2.Dipart. Ingegneria Meccanica e GestionalePolitecnico di BariBARIITALY

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