Advances in the Measurement of Surfaces Properties Utilizing Illumination at Angles Beyond Total Reflection
In preceding papers the authors have employed evanescent illumination to perform measurement of depth information on rough surfaces. In the developments presented in this paper new experimental evidence has been gathered. This information provides additional elements that help to formulate a more complete model of the phenomena taking place. The carried out measurements when confronted with independently gather information support the formulated model.
Keywordsevanescent waves surface roughness high accuracy topography
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