On-Line Process Control Compositional Analysis of Aluminum Films Containing a Low Percentage of Copper
Aluminum film conducting stripes are widely used for semiconductor device interconnection networks. The addition of a low percentage of copper significantly increases their life. Composition must be controlled to maintain product quality.
The paper discusses various methods used to analyze the copper composition in the aluminum films, and adaptation of one of these methods for process control application. A portable instrument designed for field use was adapted for use as an on-line instrument.
KeywordsAluminum Film Laboratory Instrument Copper Percentage Atomic Absorption Method Copper Mass
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