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Cone-beam X-ray Microtomography

  • Ge Wang
  • Tein-Hsiang Lin
  • Douglus M. Shinozaki
  • Hyo-gun Kim
  • Ping-chin Cheng

Abstract

Studies of three-dimensional microstructures in opaque specimens have been a problem in both biological and material sciences. Because of the relatively small absorption cross section for X-rays even for optically opaque materials, X-ray microscopy and microtomography is a useful method for revealing internal microstructure (Cheng and Jan, 1987; Cheng et al., 1989, 1990; Schmahl and Cheng, 1991; Graeff and Engelke, 1991). Among different kinds of X-ray microscopies, shadow projection microscopy is the most convenient technique. Recently there has been increasing interest in developing a microtomography capability on conventional X-ray shadow projection microscopes. An X-ray shadow projection microscope system is being developed in our laboratories (Cheng et al., 1990, 1991a, 1991 b) (Figure 9-1). This system uses a scannable point X-ray source generated by a microfocused electron beam. A specimen is mounted on a movable (both rotation and translation) mechanical stage. Projection images are recorded on a cooled CCD camera (Figure 9-2), transferred into a computer and manipulated for microtomography. The wavefront emerges from the fine focus point source as an ever expanding sphere, and the specimen being examined intercepts a portion of the wavefront. The part of the wavefront subtended by the specimen is a three-dimensional cone, giving rise to the nomenclature “cone-beam tomography”. The three-dimensional image is reconstructed from the sequence of two-dimensional images recorded from different directions. Each two-dimensional image is recorded for a fixed source/specimen position. Modern CCD detectors are relatively inexpensive, and quite sensitive with good signal-to-noise ratio. Digital read-out of the two-dimensional images is also relatively straightforward, as the technology is used for the ubiquitous CCD camera.

Keywords

Point Spread Function Projection Data Reconstruction Error Longitudinal Variation Horizontal Slice 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag New York Inc. 1994

Authors and Affiliations

  • Ge Wang
  • Tein-Hsiang Lin
  • Douglus M. Shinozaki
  • Hyo-gun Kim
  • Ping-chin Cheng

There are no affiliations available

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