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Extension of Microwave Detection and Frequency Measuring Techniques into the Optical Region

Chapter

Abstract

Precise frequency measurements in the far-infrared and infrared have made possible highly accurate spectroscopic observations in these regions. This article gives a review of the general properties of the high-speed diode element used in the frequency measurements. Other future applications are discussed in the concluding section.

Keywords

Tunneling Junction Optical Region Microwave Region Wire Antenna Microwave Detection 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1974

Authors and Affiliations

  1. 1.Department of PhysicsMassachusetts Institute of TechnologyCambridgeUSA

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