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Characterization of Solid Surfaces pp 147–178Cite as

X-Ray Diffraction Methods

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Abstract

The application of x-ray diffraction to surface characterization requires some consideration of the definition of the material surface. If it is the present-day surface definition of one, five, or twenty monolayers that the ion-scattering, Auger, or ESCA techniques see, then x-ray diffraction probably has no place in surface characterization. However, by returning to the definition used a decade ago, where the first 5–10 K Å of a bulk material or any thin film deposited upon a substrate was considered the material surface, then x-ray diffraction does have an important application.

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Author information

Authors and Affiliations

  1. Materials Characterization Laboratory, Texas Instruments, Inc., Dallas, Texas, USA

    Robert D. Dobrott

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  1. Robert D. Dobrott
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Editor information

Editors and Affiliations

  1. Materials Characterization Laboratory, Texas Instruments Incorporated, Dallas, Texas, USA

    Philip F. Kane  & Graydon B. Larrabee  & 

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© 1974 Plenum Press, New York

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Dobrott, R.D. (1974). X-Ray Diffraction Methods. In: Kane, P.F., Larrabee, G.B. (eds) Characterization of Solid Surfaces. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-4490-2_8

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  • DOI: https://doi.org/10.1007/978-1-4613-4490-2_8

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-4492-6

  • Online ISBN: 978-1-4613-4490-2

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