Advertisement

Scanning Electron Microscopy

  • Om Johari
  • A. V. Samudra

Abstract

A detailed examination of materials is vital to any investigation relating to the processing properties and behavior of materials. Characterization includes all information relating to topographical features, morphology, habit and distribution, identification of differences based on chemistry, crystal structure, physical properties, and subsurface features, among others.

Keywords

Auger Electron Spectroscopy Transmission Scanning Electron Microscope Primary Beam Incident Electron Beam Electron Optical System 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    O. Johari, Total materials characterization with the scanning electron microscope, Res./Develop. 22(7), 12–20(1971).Google Scholar
  2. 2.
    P. G. T. Howell and A. Boyde, in Scanning Electron Microscopy/1972 (O. Johari and I. Corvin, eds.) pp. 233–240, IIT Research Institute, Chicago (1972).Google Scholar
  3. 3.
    A. Boyde, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 105–112, IIT Research Institute, Chicago (1970).Google Scholar
  4. 4.
    A. R. Dinnis, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 41–48, IIT Research Institute, Chicago (1971).Google Scholar
  5. 5.
    O. Johari, I. Corvin, R. F. Dragen, and N. M. Parikh, in Scanning Electron Microscopy/1969 (O. Johari, ed.) pp. 277–284, IIT Research Institute, Chicago (1969).Google Scholar
  6. 6.
    C. W. Price and D. W. Johnson, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 145–152, IIT Research Institute, Chicago (1971).Google Scholar
  7. 7.
    G. E. Pfefferkorn and R. Blaschke, Staubuntersuchungen mit hilfe des raster-elektronenmikroskops stereoscan, Staub-Reinhalt. Luft 27, 30–33 (1967).Google Scholar
  8. 8.
    P. R. Thornton, Scanning Electron Microscopy, Chapman and Hall, London (1968).Google Scholar
  9. 9.
    H. Elias, Stereology, Springer-Verlag, Berlin (1967).CrossRefGoogle Scholar
  10. 10.
    G. Dorfler and J. C. Russ, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 65–72, IIT Research Institute, Chicago (1970).Google Scholar
  11. 11.
    E. W. White, H. Gorz, G. G. Johnson, Jr., and R. E. McMillan, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 57–64, IIT Research Institute, Chicago (1970).Google Scholar
  12. 12.
    D. W. Braggins, A. M. Gardner, and D. W. Gibbard, in Scanning Electron Microscopy/ 1971 (O. Johari and I. Corvin, eds.) pp. 393–400, IIT Research Institute, Chicago (1971).Google Scholar
  13. 13.
    E. Zeitler, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 25–32, IIT Research Institute, Chicago (1971).Google Scholar
  14. 14.
    A. V. Crewe, High-resolution scanning microscopy of biological specimens, Ber. Bunsen Ges. Phys. Chem. 74, 1181–1187 (1970).Google Scholar
  15. 15.
    J. C. Russ, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 65–72, IIT Research Institute, Chicago (1971).Google Scholar
  16. 16.
    J. C. Russ and A. Kabaya, in Scanning Electron Microscopy/1969 (O. Johari, ed.) pp. 57–64, IIT Research Institute, Chicago (1969).Google Scholar
  17. 17.
    L. V. Sutfin and R. E. Ogilvie, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 17–24, IIT Research Institute, Chicago (1970).Google Scholar
  18. 18.
    O. Johari, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 529–536, IIT Research Institute, Chicago (1971).Google Scholar
  19. 19.
    W. Reuther, Electron probe microanalysis, Surface Sci. 25, 80–119 (1971).CrossRefGoogle Scholar
  20. 20.
    E. Berkey and G. A. Whitlow, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 73–80, IIT Research Institute, Chicago (1971).Google Scholar
  21. 21.
    N. C. MacDonald, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 89–96, IIT Research Institute, Chicago (1971).Google Scholar
  22. 22.
    C. C. Chang, Auger electron spectroscopy, Surface Sci. 25, 53–59 (1971).CrossRefGoogle Scholar
  23. 23.
    N. C. MacDonald, H. L. Marcus, and P. W. Palmberg, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 25–32, IIT Research Institute, Chicago (1970).Google Scholar
  24. 24.
    R. L. Weber, Auger electron spectroscopy for thin film analysis, Res./ Develop. 23(10), 22–28 (1972).Google Scholar
  25. 25.
    G. Remond, S. Kimoto, and H. Okuzumi, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 33–40, IIT Research Institute, Chicago (1970).Google Scholar
  26. 26.
    M. D. Muir, P. R. Grant, G. Hubbard, and J. Mundel, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 401–408, IIT Research Institute, Chicago (1971).Google Scholar
  27. 27.
    D. G. Coates, Kikuchi live reflection patterns observed with the scanning electron microscope, Phil. Mag. 6, 1179–1184 (1967).CrossRefGoogle Scholar
  28. 28.
    D. G. Coates, in Scanning Electron Microscopy/1969 (O. Johari, ed.) pp. 27–40, IIT Research Institute, Chicago (1969).Google Scholar
  29. 29.
    G. R. Booker, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 489–496, IIT Research Institute, Chicago (1970).Google Scholar
  30. 30.
    G. R. Booker, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 465–472, IIT Research Institute, Chicago (1971).Google Scholar
  31. 31.
    R. Stickler, C. W. Hughes, and G. R. Booker, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 473–480, IIT Research Institute, Chicago (1971).Google Scholar
  32. 32.
    D. C. Joy, G. R. Booker, E. O. Fearon, and M. Bevis, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 497–504, IIT Research Institute, Chicago (1971).Google Scholar
  33. 33.
    W. C. Lane, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 41–48, IIT Research Institute, Chicago (1970).Google Scholar
  34. 34.
    N. Ujiiye, S. Kimoto, and Y. Kawasaki, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 97–104, IIT Research Institute, Chicago (1971).Google Scholar
  35. 35.
    E. K. Brandis, F. W. Anderson, and R. Hoover, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 505–510, IIT Research Institute, Chicago (1971).Google Scholar
  36. 36.
    J. M. CowJey, D. J. Smith, and G. A. Sussex, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 9–16, IIT Research Institute, Chicago (1970).Google Scholar
  37. 37.
    P. Echlin, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 225–232, IIT Research Institute, Chicago (1971).Google Scholar
  38. 38.
    A. Boyde, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 1–8, IIT Research Institute, Chicago (1971).Google Scholar
  39. 39.
    G. A. Stoke, M. Halioua, A. J. Saffir, and D. J. Evins, in Scanning Electron Microscopy/ 1971 (O. Johari and I. Corvin, eds.) pp. 57–64, IIT Research Institute, Chicago (1971).Google Scholar
  40. 40.
    N. K. Tovey, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 49–56, IIT Research Institute, Chicago (1971).Google Scholar
  41. 41.
    T. L. Hayes, R. M. Glaeser, and J. B. Pawley, in Proceedings of the 29th Annual EMSA Meeting, pp. 410–411, Claitor Publishing House, Baton Rouge (1969).Google Scholar
  42. 42.
    C. W. Oatley, Isolation of potential contrast in the scanning electron microscope, J. Sci. Instr. 2, 742–744 (1969).CrossRefGoogle Scholar
  43. 43.
    O. C. Wells, in Scanning Electron Microscopy/1972 (O. Johari and I. Corvin, eds.) pp. 169–176, IIT Research Institute, Chicago (1972).Google Scholar
  44. 44.
    A. N. Broers, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 1–8, IIT Research Institute, Chicago (1970).Google Scholar

Copyright information

© Plenum Press, New York 1974

Authors and Affiliations

  • Om Johari
    • 1
  • A. V. Samudra
    • 2
  1. 1.IIT Research InstituteChicagoUSA
  2. 2.LaSalle Steel CompanyHammondUSA

Personalised recommendations