Skip to main content
SpringerLink
Log in

Scanning Electron Microscopy

  • Chapter
Characterization of Solid Surfaces

Abstract

A detailed examination of materials is vital to any investigation relating to the processing properties and behavior of materials. Characterization includes all information relating to topographical features, morphology, habit and distribution, identification of differences based on chemistry, crystal structure, physical properties, and subsurface features, among others.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. O. Johari, Total materials characterization with the scanning electron microscope, Res./Develop. 22(7), 12–20(1971).

    Google Scholar 

  2. P. G. T. Howell and A. Boyde, in Scanning Electron Microscopy/1972 (O. Johari and I. Corvin, eds.) pp. 233–240, IIT Research Institute, Chicago (1972).

    Google Scholar 

  3. A. Boyde, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 105–112, IIT Research Institute, Chicago (1970).

    Google Scholar 

  4. A. R. Dinnis, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 41–48, IIT Research Institute, Chicago (1971).

    Google Scholar 

  5. O. Johari, I. Corvin, R. F. Dragen, and N. M. Parikh, in Scanning Electron Microscopy/1969 (O. Johari, ed.) pp. 277–284, IIT Research Institute, Chicago (1969).

    Google Scholar 

  6. C. W. Price and D. W. Johnson, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 145–152, IIT Research Institute, Chicago (1971).

    Google Scholar 

  7. G. E. Pfefferkorn and R. Blaschke, Staubuntersuchungen mit hilfe des raster-elektronenmikroskops stereoscan, Staub-Reinhalt. Luft 27, 30–33 (1967).

    Google Scholar 

  8. P. R. Thornton, Scanning Electron Microscopy, Chapman and Hall, London (1968).

    Google Scholar 

  9. H. Elias, Stereology, Springer-Verlag, Berlin (1967).

    Book  Google Scholar 

  10. G. Dorfler and J. C. Russ, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 65–72, IIT Research Institute, Chicago (1970).

    Google Scholar 

  11. E. W. White, H. Gorz, G. G. Johnson, Jr., and R. E. McMillan, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 57–64, IIT Research Institute, Chicago (1970).

    Google Scholar 

  12. D. W. Braggins, A. M. Gardner, and D. W. Gibbard, in Scanning Electron Microscopy/ 1971 (O. Johari and I. Corvin, eds.) pp. 393–400, IIT Research Institute, Chicago (1971).

    Google Scholar 

  13. E. Zeitler, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 25–32, IIT Research Institute, Chicago (1971).

    Google Scholar 

  14. A. V. Crewe, High-resolution scanning microscopy of biological specimens, Ber. Bunsen Ges. Phys. Chem. 74, 1181–1187 (1970).

    Google Scholar 

  15. J. C. Russ, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 65–72, IIT Research Institute, Chicago (1971).

    Google Scholar 

  16. J. C. Russ and A. Kabaya, in Scanning Electron Microscopy/1969 (O. Johari, ed.) pp. 57–64, IIT Research Institute, Chicago (1969).

    Google Scholar 

  17. L. V. Sutfin and R. E. Ogilvie, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 17–24, IIT Research Institute, Chicago (1970).

    Google Scholar 

  18. O. Johari, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 529–536, IIT Research Institute, Chicago (1971).

    Google Scholar 

  19. W. Reuther, Electron probe microanalysis, Surface Sci. 25, 80–119 (1971).

    Article  Google Scholar 

  20. E. Berkey and G. A. Whitlow, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 73–80, IIT Research Institute, Chicago (1971).

    Google Scholar 

  21. N. C. MacDonald, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 89–96, IIT Research Institute, Chicago (1971).

    Google Scholar 

  22. C. C. Chang, Auger electron spectroscopy, Surface Sci. 25, 53–59 (1971).

    Article  CAS  Google Scholar 

  23. N. C. MacDonald, H. L. Marcus, and P. W. Palmberg, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 25–32, IIT Research Institute, Chicago (1970).

    Google Scholar 

  24. R. L. Weber, Auger electron spectroscopy for thin film analysis, Res./ Develop. 23(10), 22–28 (1972).

    CAS  Google Scholar 

  25. G. Remond, S. Kimoto, and H. Okuzumi, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 33–40, IIT Research Institute, Chicago (1970).

    Google Scholar 

  26. M. D. Muir, P. R. Grant, G. Hubbard, and J. Mundel, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 401–408, IIT Research Institute, Chicago (1971).

    Google Scholar 

  27. D. G. Coates, Kikuchi live reflection patterns observed with the scanning electron microscope, Phil. Mag. 6, 1179–1184 (1967).

    Article  Google Scholar 

  28. D. G. Coates, in Scanning Electron Microscopy/1969 (O. Johari, ed.) pp. 27–40, IIT Research Institute, Chicago (1969).

    Google Scholar 

  29. G. R. Booker, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 489–496, IIT Research Institute, Chicago (1970).

    Google Scholar 

  30. G. R. Booker, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 465–472, IIT Research Institute, Chicago (1971).

    Google Scholar 

  31. R. Stickler, C. W. Hughes, and G. R. Booker, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 473–480, IIT Research Institute, Chicago (1971).

    Google Scholar 

  32. D. C. Joy, G. R. Booker, E. O. Fearon, and M. Bevis, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 497–504, IIT Research Institute, Chicago (1971).

    Google Scholar 

  33. W. C. Lane, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 41–48, IIT Research Institute, Chicago (1970).

    Google Scholar 

  34. N. Ujiiye, S. Kimoto, and Y. Kawasaki, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 97–104, IIT Research Institute, Chicago (1971).

    Google Scholar 

  35. E. K. Brandis, F. W. Anderson, and R. Hoover, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 505–510, IIT Research Institute, Chicago (1971).

    Google Scholar 

  36. J. M. CowJey, D. J. Smith, and G. A. Sussex, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 9–16, IIT Research Institute, Chicago (1970).

    Google Scholar 

  37. P. Echlin, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 225–232, IIT Research Institute, Chicago (1971).

    Google Scholar 

  38. A. Boyde, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 1–8, IIT Research Institute, Chicago (1971).

    Google Scholar 

  39. G. A. Stoke, M. Halioua, A. J. Saffir, and D. J. Evins, in Scanning Electron Microscopy/ 1971 (O. Johari and I. Corvin, eds.) pp. 57–64, IIT Research Institute, Chicago (1971).

    Google Scholar 

  40. N. K. Tovey, in Scanning Electron Microscopy/1971 (O. Johari and I. Corvin, eds.) pp. 49–56, IIT Research Institute, Chicago (1971).

    Google Scholar 

  41. T. L. Hayes, R. M. Glaeser, and J. B. Pawley, in Proceedings of the 29th Annual EMSA Meeting, pp. 410–411, Claitor Publishing House, Baton Rouge (1969).

    Google Scholar 

  42. C. W. Oatley, Isolation of potential contrast in the scanning electron microscope, J. Sci. Instr. 2, 742–744 (1969).

    Article  Google Scholar 

  43. O. C. Wells, in Scanning Electron Microscopy/1972 (O. Johari and I. Corvin, eds.) pp. 169–176, IIT Research Institute, Chicago (1972).

    Google Scholar 

  44. A. N. Broers, in Scanning Electron Microscopy/1970 (O. Johari, ed.) pp. 1–8, IIT Research Institute, Chicago (1970).

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. IIT Research Institute, Chicago, Illinois, USA

    Om Johari

  2. LaSalle Steel Company, Hammond, Indiana, USA

    A. V. Samudra

Authors
  1. Om Johari
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. A. V. Samudra
    View author publications

    You can also search for this author in PubMed Google Scholar

Editor information

Editors and Affiliations

  1. Materials Characterization Laboratory, Texas Instruments Incorporated, Dallas, Texas, USA

    Philip F. Kane  & Graydon B. Larrabee  & 

Rights and permissions

Reprints and permissions

Copyright information

© 1974 Plenum Press, New York

About this chapter

Cite this chapter

Johari, O., Samudra, A.V. (1974). Scanning Electron Microscopy. In: Kane, P.F., Larrabee, G.B. (eds) Characterization of Solid Surfaces. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-4490-2_6

Download citation

  • DOI: https://doi.org/10.1007/978-1-4613-4490-2_6

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-4492-6

  • Online ISBN: 978-1-4613-4490-2

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics

Search

Navigation