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Specimen Preparation, Special Techniques, and Applications of the Scanning Electron Microscope

  • D. E. Newbury
  • H. Yakowitz

Abstract

In the first ten years of commercial availability of the scanning electron microscope (SEM), the instrument has been applied in many fields in the physical and biological sciences. In this chapter, we shall present illustrative examples of the types of problems in materials science for which the SEM can provide useful information to the analyst. By no means are these examples a complete description of the scope of SEM applications. A more adequate appreciation of the wide range of SEM studies that have been carried out can be obtained by consulting the proceedings of the yearly conferences on scanning electron microscopy.(1,2)

Keywords

Annealing Twin Secondary Electron Emission Stripe Domain Chapter Versus NAND Gate 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1975

Authors and Affiliations

  • D. E. Newbury
    • 1
  • H. Yakowitz
    • 1
  1. 1.Institute for Materials ResearchNational Bureau of StandardsUSA

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