Practical Aspects of X-Ray Microanalysis

  • H. Yakowitz
  • J. I. Goldstein

Abstract

For the solution of many practical problems, identification of microconstituents is all that is required. For example, foreign matter may have somehow incorporated itself into the grain boundary of a material, with deleterious effect. Then the identification of the foreign substance, in order to locate its source, completes the analyst’s job.

Keywords

Zinc Nickel Zirconium Chromium Uranium 

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References

  1. 1.
    R. Fitzgerald, K. Keil, and K. F. J. Heinrich, Science, 159, 528 (1968).CrossRefGoogle Scholar
  2. 2.
    E. Lifshin and M. F. Ciccarelli, in SEM/1973 Proceedings of the 6th Annual SEM Symposium (O. Johari, ed.), IITRI, Chicago, Illinois (1973), p. 89.Google Scholar
  3. 3.
    J. M. Short in SEM/1973 Proceedings of the 6th Annual SEM Symposium (O. Johari, ed.), IITRI, Chicago, Illinois (1973), p. 106.Google Scholar
  4. 4.
    E. Lifshin, M. F. Ciccarelli, and R. B. Bolon, in Proceedings of the 8th National Conference on Electron Probe Analysis, EPASA, New Orleans (1973), Paper 29.Google Scholar
  5. 5.
    S. J. B. Reed and N. G. Ware, X-Ray Spectrometry, 2, 69 (1973).CrossRefGoogle Scholar
  6. 6.
    L. S. Birks, Electron Probe Microanalysis, 2nd ed., Wiley—Interscience, New York (1971), p. 41.Google Scholar
  7. 7.
    K. F. J. Heinrich and M. A. Giles, NBS Technical Note 406 (1967).Google Scholar
  8. 8.
    K, F. J. Heinrich, NBS Technical Note 278 (1967).Google Scholar
  9. 9.
    L. Curgenven and P. Duncumb, Tube Investments Research Labs Report No. 303 (1971).Google Scholar
  10. 10.
    R. H. Barkalow, R. W. Kraft, and J. I. Goldstein, Met. Trans., 3, 919 (1972).CrossRefGoogle Scholar
  11. 11.
    H. Yakowitz and K. F. J. Heinrich, J. Res. NBS, A. Phys. Chem. 73A, 113 (1969).Google Scholar
  12. 12.
    H. Hahn, A. P. Divecha, P. Lare, and B. Dennison, Melpar Report. 5192 (1966), unpublished.Google Scholar
  13. 13.
    H. Yakowitz, W. D. Jenkins, and H. Hahn, J. Res. NBS, A. Phys. Chem., 72A, No. 3 (1968).Google Scholar
  14. 14.
    O. R. Bergman, G. R. Cowan, and A. H. Holzman, Trans. Met. Soc. AIME, 236, 646 (1966).Google Scholar
  15. 15.
    B. Z. Weiss, Z. Metallkunde, 62, 159 (1971).Google Scholar
  16. 16.
    H. Yakowitz and K. F. J. Heinrich, Mikrochim. Acta, 5, 182 (1968).Google Scholar
  17. 17.
    H. Yakowitz, in Fifty Years of Progress in Metallographic Techniques, ASTM-STP 430, Am. Soc. Testing Materials (1968), p. 383.Google Scholar
  18. 18.
    M. L. Picklesimer and G. Hallerman, Report ORNL-TM-1591 (1966).Google Scholar
  19. 19.
    R. Kiessling and N. Lange, Non-Metallic Inclusions in Steel, Special Report 90, The Iron and Steel Institute, London (1964).Google Scholar
  20. 20.
    E. C. W. Perryman, Metal Industry, London, 79, 23, 71, 111, 131 (1951).Google Scholar
  21. 21.
    M. L. Picklesimer, Report ORNL-2296 (1957).Google Scholar
  22. 22.
    ASTM, Methods of Metallographic Specimen Preparation, ASTM-STP 285 (1960).Google Scholar
  23. 23.
    R. L. Anderson, Revealing Microstructures in Metals, Westinghouse Research Laboratories, Scientific Paper 425-COOO-P2 (1961).Google Scholar
  24. 24.
    D. E. Cadwell and P. W. Weiblen, Economic Geology, 60, 1320 (1965).CrossRefGoogle Scholar
  25. 25.
    G. L. Kehl, Principles of Metallographic Laboratory Practice, 3rd. ed., McGraw-Hill, New York (1949).Google Scholar
  26. 26.
    C. M. Taylor and A. S. Radtke, Economic Geology, 60, 1306 (1965).CrossRefGoogle Scholar
  27. 27.
    W. Tegart, Electrolytic and Chemical Polishing of Metals in Research and Industry, 2nd rev. ed., Pergamon Press, London and New York (1959).Google Scholar
  28. 28.
    A. T. Nelms, Energy Loss and Range of Electrons and Positions, National Bureau of Standards, Circular 577 (1956).Google Scholar
  29. 29.
    I. Adler, in X-Ray and Electron Probe Analysis, ASTM-STP 349, Am. Soc. Testing Materials (1963), p. 183.Google Scholar
  30. 30.
    J. V. Smith, “Production of X-Rays,” notes of a course taught at California Institute of Technology, Pasadena, California (1965).Google Scholar
  31. 31.
    J. I. Goldstein, R. E. Hanneman, and R. E. Ogilvie, Trans. Met. Soc. AIME, 233, 812 (1965).Google Scholar
  32. 32.
    J. I. Goldstein, F. J. Majeske, and H. Yakowitz, in Advances in X-Ray Analysis, Vol. 10, Plenum Press, New York (1967), p. 431.Google Scholar
  33. 33.
    R. E. Michaelis, H. Yakowitz, and G. A. Moore, J. Res. NBS, 68A, 343 (1964).Google Scholar
  34. 34.
    K. F. J. Heinrich, R. L. Myklebust, S. D. Rasberry, and R. E. Michaelis, NBS Special Publication 260–28 (1971).Google Scholar
  35. 35.
    H. Yakowitz, R. E. Michaelis, and D. L. Vieth, in Advances in X-Ray Analysis, Vol. 12, Plenum Press, New York (1969), p. 418.Google Scholar
  36. 36.
    H. Yakowitz, C. E. Fiori, and R. E. Michaelis, NBS Special Publication 260–22 (1971).Google Scholar
  37. 37.
    H. Yakowitz, D. L. Vieth, K. F. J. Heinrich, and R. E. Michaelis, in Advances in X-Ray Analysis, Vol. 9, Plenum Press, New York (1966), p. 289.Google Scholar
  38. 38.
    H. Yakowitz, A. W. Ruff, Jr., and R. E. Michaelis, NBS Special Publication 260–43 (1972).Google Scholar
  39. 39.
    J. I. Goldstein and R. E. Ogilvie, Geochim. Cosmochim. Acta, 27, 623 (1963).CrossRefGoogle Scholar
  40. 40.
    J. I. Goldstein and H. J. Axon, Naturwiss., 60, 313 (1973).CrossRefGoogle Scholar
  41. 41.
    K. Keil and C. A. Andersen, Geochim. Cosmochim. Acta, 29, 621 (1965).CrossRefGoogle Scholar
  42. 42.
    R. H. Barkalow, R. W. Kraft, and J. I. Goldstein, Met. Trans. 3, 919 (1972).CrossRefGoogle Scholar
  43. 43.
    C. Matano, Japan. J. Phys., 8, 109 (1932-3).Google Scholar
  44. 44.
    E. Lifshin and R. E. Hanneman, General Electric Research Laboratory Reports 65-RL-3944M (1965) and 66-C-250 (1966).Google Scholar
  45. 45.
    J. I. Goldstein and R. E. Ogilvie, in X-Ray Optics and Microanalysis, (R. Castaing, P. Deschamps, and J. Philibert, ed.), Hermann, Paris (1966), p. 594.Google Scholar
  46. 46.
    A. S. Doan, Jr. and J. I. Goldstein, Met. Trans., 1, 1759 (1970).CrossRefGoogle Scholar
  47. 47.
    J. Rucklidge, in Proceedings of the Sixth International Conference on X-Ray Optics and Microanalysis (G. Shinoda, K. Kohra, and T. Ichinokawa, eds.) University of Tokyo Press (1972), p. 743.Google Scholar
  48. 48.
    H. Yakowitz and K. F. J. Heinrich, Metallography, 1, 55 (1968).CrossRefGoogle Scholar

Copyright information

© Plenum Press, New York 1975

Authors and Affiliations

  • H. Yakowitz
    • 1
  • J. I. Goldstein
    • 2
  1. 1.Institute for Materials Research, Metallurgy DivisionNational Bureau of StandardsUSA
  2. 2.Department of Metallurgy and Materials ScienceLehigh UniversityBethlehemUSA

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