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Wavelength Standards

  • Kenneth M. Baird
Part of the Physics of Atoms and Molecules book series (PAMO)

Abstract

The measurement of wavelengths has long been a fundamental part of spectroscopy. While it is true that the spectroscopist is interested primarily in energy-level differences, these are observed as emitted radiation frequencies which are related through the velocity of light to wavelengths and traditionally have been measured as wavelengths. With the development of modern spectroscopy, wavelengths are measured over a range extending from picometers to centimeters, requiring a wide variety of techniques, instruments, and detectors, of which no single combination can be used to cover a very large fraction of the spectrum. Because of this, spectroscopy requires, in addition to a primary standard, an extensive system of secondary standards in order to provide a common absolute scale over the whole spectrum. Such a system has resulted from the contributions of a great many individual workers, as well as laboratories such as the U.S. Natlonal Bureau of Standards and has benefited from coordination by international bodies such as the International Astronomical Union (IAU), the Inter-Union Commission on Spectroscopy of ICSU, and the International Committee of Weights and Measures (CIPM). These organizations report the continual updating and extension of the system of wavelengths standards.(1–3)

Keywords

Hyperfine Structure Primary Standard Secondary Standard Absorption Tube International Astronomical Union 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    International Astronomical Union (IAU), Trans. 16A, 31 (1976).Google Scholar
  2. 2.
    Comité Consultatif pour la Definition du Mètre, 3rd Session, pp. 9–20, Gauthier Villars, Paris (1962).Google Scholar
  3. 3.
    Tables of Wave Numbers for the Calibration of Infra Spectrometers 2nd ed., Ed. A. R. H. Cole, Pergamon, London (1976).Google Scholar
  4. 4.
    B. Edlén, Metrologia 2, 71 (1966).ADSCrossRefGoogle Scholar
  5. 5.
    E. R. Peck and K. Reeder, J. Opt. Soc. Am. 62, 958 (1972).ADSCrossRefGoogle Scholar
  6. 6.
    K. H. Hart and K. M. Baird, Can. J. Phys. 39, 781 (1961).ADSCrossRefGoogle Scholar
  7. 7.
    CIPM Procès Verbaux, 2nd Ser, 28, 70 (1960).Google Scholar
  8. 8.
    IAU Trans. 11B, 89 (1961).Google Scholar
  9. 9.
    B. Edlén, in Polarisation, Matière et Rayonnement, pp. 219–227, Presses Universitaires de France, Paris (1969).Google Scholar
  10. 10.
    J. Terrien, Rep. Prog. Phys. 39, 1067 (1976).ADSCrossRefGoogle Scholar
  11. 11.
    R. G. Breene, Jr., The Shift and Shape of Spectral Lines, Pergamon Press, London (1961).Google Scholar
  12. 12.
    V. Kaufman and B. Edlén, J. Phys. Chem. Ref. Data 3, 825 (1974).ADSCrossRefGoogle Scholar
  13. 13.
    W. R. C. Rowley, Comité Consultatif pour la Definition du Mètre, 4th Session, pp. M108–113, Offilib, Paris (1970).Google Scholar
  14. 14.
    Methods of Experimental Physics, Vol. 13A, Spectroscopy, Ed. D. Williams, pp. 205–227 and 259-274, Academic Press, New York (1976).Google Scholar
  15. 15.
    B. Edlén, Rep. Prog. Phys. 26, 181 (1963).ADSCrossRefGoogle Scholar
  16. 16.
    The Encyclopedia of Spectroscopy, Ed. G. L. Clark, p. 453, Reinhold, New York (1960).Google Scholar
  17. 17.
    Methods of Experimental Physics, Vol. 13A, Spectroscopy, Ed. D. Williams, Academic Press, New York (1976).Google Scholar
  18. 18.
    MIT Wavelength Tables, John Wiley, New York (1960).Google Scholar
  19. 19.
    P. Connes and G. Michel, Appl. Opt. 14, 2067 (1975).ADSCrossRefGoogle Scholar
  20. 20.
    J. L. Hall and S. A. Lee, Appl. Phys. Lett. 29, 367 (1976).ADSCrossRefGoogle Scholar
  21. 21.
    F. V. Kowalski, R. T. Hawkins, and A. L. Schawlow, J. Opt. Soc. Am. 66, 956 (1976).ADSCrossRefGoogle Scholar
  22. 22.
    R. D. Deslattes, in Proceedings of Course No. LXVIII “Metrology and Fundamental Constants,” Summer School of Physics—Enrico Fermi, Varenna, Italy, July 1976.Google Scholar
  23. 23.
    D. A. Jennings, F. R. Petersen, and K. M. Evenson, Appl. Phys. Lett. 26, 510 (1975).ADSCrossRefGoogle Scholar
  24. 24.
    Laser Spectroscopy, Proceedings of the Second International Conference, Megeve, France, June 1975, Eds S. Haroche, J. C. Pebay-Peyroula, T. W. Hansch, and S. E. Harris, Springer-Verlag, Berlin (1975).Google Scholar
  25. 25.
    Tunable Lasers and Applications, Proceedings of the Loen Conference, Norway, 1976, Eds. A. Mooradian, T. Jaeger, and P. Stokseth, Springer-Verlag, Berlin (1976).Google Scholar
  26. 26.
    D. J. E. Knight and P. T. Woods, J. Phys. E 9, 898 (1976).ADSCrossRefGoogle Scholar
  27. 27.
    High Resolution Laser Spectroscopy, Ed. K. Shimoda, Topics in Applied Physics, Vol. 13, Springer-Verlag, Berlin (1976); see also appropriate chapters in the present book.Google Scholar
  28. 28.
    Quinzième Conférence Général des Poids et Mesures, Paris, 1975, Comptes Rendus, Bureau Internal des Poids et Mesures (publishers), Paris.Google Scholar
  29. 29.
    IAU Trans. 15B, 55 (1973).Google Scholar
  30. 30.
    Proceedings of the Second Frequency Standards and Metrology Symposium, July 1976, Copper Mountain, Colorado, U.S. Natl. Bur. Sts.Google Scholar
  31. 31.
    K. M. Baird and G. R. Hanes, Rep. Prog. Phys. 37, 927 (1974).ADSCrossRefGoogle Scholar
  32. 32.
    J. L. Hall, in Atomic Physics, Vol. 3, Eds S. J. Smith and G. K. Walters, pp. 615–646, Plenum Press, New York (1973).Google Scholar
  33. 33.
    J. L. Hall, C. J. Bordé, and K. Uehara, Phys. Rev. Lett. 37, 1339 (1976).ADSCrossRefGoogle Scholar
  34. 34.
    V. P. Chebotaev, in Proceedings of the International Enrico Fermi School of Physics, Metrology and Physical Constants, Varenna, Italy, 1976, North-Holland, Amsterdam (in press).Google Scholar
  35. 35.
    Comité Consultatif pour la Definition du Mètre, 5th Session, Offilib, Paris (1973).Google Scholar
  36. 36.
    K. M. Evenson, J. S. Wells, F. R. Petersen, B. L. Danielson, and G. W. Day, Appl. Phys. Lett. 22, 192 (1973).ADSCrossRefGoogle Scholar
  37. 37.
    T. G. Blaney, G. J. Edwards, B. W. Joliffe, D. J. E. Knight, and P. T. Woods, J. Phys. D. 9, 1323 (1976).ADSCrossRefGoogle Scholar
  38. 38.
    G. R. Hanes, K. M. Baird, and D. DeRemigis, Appl. Opt. 12, 1600 (1973).ADSCrossRefGoogle Scholar
  39. 39.
    L. Hackel, R. Hackel, and S. Ezekiel, in Ref. 30.Google Scholar
  40. 40.
    C. Freed and A. Javan, Appl Phys. Lett. 16, 53 (1970).ADSCrossRefGoogle Scholar
  41. 41.
    M. Ouhayoun and C. J. Bordé, Metrologia 13, 149 (1977).ADSCrossRefGoogle Scholar
  42. 42.
    Yu. S. Dimin, U. M. Tatarenkov, and P. S. Shumiatskii, Sov. J. Quantum Electron. 3, 2612 (1975); or O. N. Kompanets, A. R. Kukudzhanov, U. S. Letokov, E. L. Michailov, in Ref. 30.ADSGoogle Scholar
  43. 43.
    T. W. Hansch, in Atomic Physics 4, Proceedings of the Fourth International Conference on Atomic Physics, p. 93, Plenum Press, New York (1975).CrossRefGoogle Scholar
  44. 44.
    H. A. Schuessler, Metrologia 7, 103 (1971).ADSCrossRefGoogle Scholar
  45. 45.
    F. R. Petersen, D. G. McDonald, J. D. Cupp, and B. L. Danielson, in Laser Spectroscopy, Eds. R. G. Brewer and A. Mooradian, pp. 555–569, Plenum Press, New York (1974).CrossRefGoogle Scholar
  46. 46.
    C. Freed, R. G. O’Donnell, and A. H. M. Ross, IEEE Trans. IM-25, 431 (1976).Google Scholar
  47. 47.
    B. G. Whitford, K. J. Siemsen, H. D. Riccius, and G. R. Hanes, Opt. Commun. 14, 70 (1975).ADSCrossRefGoogle Scholar
  48. 48.
    B. G. Whitford, K. J. Siemsen, and J. Reid, Opt. Commun. 22, 261 (1977).ADSCrossRefGoogle Scholar
  49. 49.
    R. S. Eng, H. Kildal, J. C. Mikkelsen, and D. L. Spears, Appl. Phys. Lett. 24, 231 (1974).ADSCrossRefGoogle Scholar
  50. 50.
    B. G. Whitford and K. J. Siemsen, Opt. Commun. 22, 11 (1977).ADSCrossRefGoogle Scholar
  51. 51.
    H. E. Radford, F. R. Petersen, D. A. Jennings, and J. A. Mucha, IEEE J. Quantum Electron. QE-13, 92 (1977).ADSCrossRefGoogle Scholar
  52. 52.
    V. Chebotayev, V. Klementyev, Yu. Kolpakov, and Yu. Matyugin, in Ref. 30.Google Scholar
  53. 53.
    H. M. Crosswhite, J. Res. Natl Bur. Sts 79A, 17 (1975).Google Scholar
  54. 54.
    A. Giacchetti, J. Blaise, C. H. Carliss, and R. Zalubas, J. Res. Natl Bur. Stand. 78A, 247 (1974).Google Scholar
  55. 55.
    C. H. Humphreys, J. Phys. Chem. Ref. Data 2, 519 (1973).ADSCrossRefGoogle Scholar
  56. 56.
    American Institute of Physics Handbook, 3rd ed., Ed. D. E. Gray, McGraw-Hill, New York (1972).Google Scholar
  57. 57.
    National Standards Reference Data Series NBS3, U.S. GPO Washington, DC (1976).Google Scholar
  58. 58.
    R. Beck, W. Englisch and K. Gurs, Table of Laser Lines in Gases and Vapors, Springer-Verlag, Berlin (1976).Google Scholar

Copyright information

© Plenum Press, New York 1979

Authors and Affiliations

  • Kenneth M. Baird
    • 1
  1. 1.Division of PhysicsNational Research Council of CanadaOttawaCanada

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