Abstract
Thin film studies are now being carried out with a variety of relatively uniform substrates; exfoliated graphite powders and compacts, graphitized carbon black, lamellar halides, alkali halides, oxides, and others. These adsorbents, although quite uniform, are not ideal, for they have varying densities and types of imperfections. Their heterogeneity can be ignored for certain kinds of investigations, but are important in others, especially in the neighborhood of phase transitions, where the films may have divergent compressibilities. While it is obviously desirable to use the most uniform substrate in every experiment, other practical requirements usually demand a compromise, involving a less ideal adsorbent. The variety of adsorbents, coupled with the sensitivity of films to heterogeneity, creates a need for some common method for measuring and specifying the heterogeneity of every experimental adsorbent and installation. The measurement should be relatively simple to carry out and interpret, inexpensive and adaptable to all types of experimental system. It is proposed here that the vapor pressure isotherms of Kr at 77K, specifically the riser of the second atomic layer, can satisfy these requirements.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
J. H. Singleton and J. D. Halsey, Jr., J. Phys. Chem. 58, 330, 1011 (1954).
G. Ehrlich and F. G. Hudda, J. Chem. Phys. 30, 493 (1959).
A. Thomy and X. Duval, J. Chim. Phys. Physicochim. Biol. 66, 1966 (1969); J37, 286, 1101 (1970).
T. Engel and R. Gomer, J. Chem. Phys. 52, 5572 (1970).
F. A. Putnam and T. Fort, Jr., J. Phys. Chem. 79, 459 (1975).
J. A. Venables, H. M. Kramer, and G. L. Price, Surf. Sci. 55, 41 (1976); 57, 782 (1976).
J. Suzanne and M. Bienfait, J. Phys. (Paris) 38 Suppl. C4, 93 (1977).
M. D. Chinn and S. C. Fain, Jr., Phys. Rev. Lett. 39, 146 (1977).
C. Marti, B. Croset, P. Thorel, and J. P. Coulomb, Surf. Sci. 65, 532 (1977).
P. M. Horn, et al., Phys. Rev. Lett. 41, 961 (1978); P. W. Stephens, et al., Phys. Rev. Lett. 43, 47 (1979).
D. M. Butler, J. A. Litzinger, G. A. Stewart, and R. B. Griffiths, Phys. Rev. Lett. 42, 1289 (1979).
M. Bienfait, J. G. Dash, and J. Stoltenberg, Phys. Rev. (to be published).
Y. Larher, J. Chim. Phys. 68, 796 (1971).
T. Takaishi and M. Mohri, J. Chem. Soc. Faraday Trans. 168, 1921 (1972).
Y. Larher and D. Haranger, Surf. Sci. 39, 100 (1973).
J. G. Dash, R. Ecke, J. Stoltenberg, O. E. Vilches, and O. J. Whittemore, Jr., J. Phys. Chem. 82, 450 (1978).
Y. Larher, Mol. Phys. 38, 789 (1979).
T. T. Chung and J. G. Dash, Surf. Sci. 66, 559 (1977).
J. K. Kjems, L. Passeil, H. Taub, J. G. Dash, and A. D. Novaco, Phys. Rev. B13, 1446 (1976).
W. F. Brooks, Brookhaven Informal Report, BNL 22617 (1967) (unpublished).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1980 Plenum Press, New York
About this chapter
Cite this chapter
Dash, J.G. (1980). On a Standardized Measure of Substrate Uniformity. In: Dash, J.G., Ruvalds, J. (eds) Phase Transitions in Surface Films. NATO Advanced Study Institutes Series, vol 51. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-3057-8_11
Download citation
DOI: https://doi.org/10.1007/978-1-4613-3057-8_11
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-3059-2
Online ISBN: 978-1-4613-3057-8
eBook Packages: Springer Book Archive