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The Application of X-Ray Topography to Materials Science

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Nondestructive Evaluation of Materials

Part of the book series: Sagamore Army Materials Research Conference Proceedings ((SAMC,volume 23))

Abstract

Basic x-ray topographic methods are described and principles of image contrast of the defect structure are briefly reviewed. Special emphasis is placed on showing the usefulness of these methods to problems in materials science and to the characterization of materials when applied in combination and in conjunction with x-ray methods of precise structural analysis.

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Authors and Affiliations

  1. Rutgers University, New Brunswick, New Jersey, USA

    S. Weissman

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  1. S. Weissman
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Editors and Affiliations

  1. Army Materials and Mechanics Research Center, Watertown, Massachusetts, USA

    John J. Burke (Chairman) (Chairman)

  2. Syracuse University, Syracuse, New York, USA

    Volker Weiss (Program Director) (Program Director)

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© 1979 Plenum Press, New York

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Weissman, S. (1979). The Application of X-Ray Topography to Materials Science. In: Burke, J.J., Weiss, V. (eds) Nondestructive Evaluation of Materials. Sagamore Army Materials Research Conference Proceedings, vol 23. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-2952-7_4

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  • DOI: https://doi.org/10.1007/978-1-4613-2952-7_4

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-2954-1

  • Online ISBN: 978-1-4613-2952-7

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