The Origin of Grain Contrast in the Scanning Acoustic Microscope
The contrast in the scanning acoustic microscope may be described by the V(z) curve (1,2). The potential of the SAM lies in the fact that the V(z) curve is a strong function of the elastic properties of the material. It is thus possible to image elastic properties with spatial resolution of the order of a micron or better provided the incident radiation has a sufficiently small wavelength.
KeywordsSurface Wave Rayleigh Wave Cylindrical Lens Electronics Letter Bulk Wave
Unable to display preview. Download preview PDF.