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Comprehensive Treatise of Electrochemistry pp 457–474Cite as

Field Ion Microscopy

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Abstract

The field ionization microscope (FIM) is, at present, the only available experimental device that routinely permits direct observation of atomic detail on surfaces. Accordingly, the FIM affords an opportunity to examine materials of electrochemical interest on a scale in which the elementary processes of electrodic reactions take place. The invention and steady improvement of the FIM has taken place over the past few decades, principally under the direction of Müller.(1) In his laboratory and, more recently, elsewhere, effort has been devoted to perfection of equipment and to studies of the basic processes of field ionization and field evaporation of the substrate. The invention by Muller in 1968 of the atom probe—a combination of FIM and time of flight mass spectrometry—has permitted fresh insights regarding the fundamental mechanisms of field ionization and field evaporation.(2) At present, the FIM is a well-developed tool for surface studies.

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References

  1. E. W. Muller, Science 149, 591–601 (1965).

    Article  Google Scholar 

  2. E. W. Muller, Proceedings Second International Conference on Solid Surfaces 1974, Jpn. J. Appl Phys., Supplement 2, Part 2, 1–10 (1974).

    Google Scholar 

  3. J. J. Southon, E. D. Boyes, P. J. Turner, and A. R. Waugh, Surf. Sci. 53, 554–580.

    Google Scholar 

  4. W. R. Graham and G. Ehrlich, Phys. Rev. Lett. 31, 1407–1408 (1973).

    Article  CAS  Google Scholar 

  5. D. W. Bassett and P. R. Webber, Surf. Sci. 70, 520–531 (1978).

    Article  CAS  Google Scholar 

  6. G. L. Kellogg, T. T. Tsong and P. Cowan, Surf. Sci. 70, 485–519 (1978).

    Article  CAS  Google Scholar 

  7. W. R. Graham, F. Hutchinson, J. J. Nadakavukaren, D. A. Reed, and S. W. Schwenterly, J. Appl. Phys. 40, 3931 (1969).

    Article  CAS  Google Scholar 

  8. W. R. Graham, D. A. Reed, and F. Hutchinson, J. Appl. Phys. 43, 2951–2956 (1972).

    Article  CAS  Google Scholar 

  9. U. T. Son and J. J. Hren, Philos. Mag. 22, 675–687 (1970).

    Article  CAS  Google Scholar 

  10. K. Stolt and J. Washburn, Philos. Mag. 34, 1169–1184 (1976).

    Article  CAS  Google Scholar 

  11. T. T. Tsong and E. W. Muller, J. Appl. Phys. 38, 545–549 (1967).

    Article  CAS  Google Scholar 

  12. Y. S. Ng., T. T. Tsong, and S. B. McLane, Phys. Rev. Lett. 42, 588–591 (1979).

    Article  CAS  Google Scholar 

  13. D. L. Cocke and J. H. Block, Surf. Sci. 70, 363–391 (1978).

    Article  CAS  Google Scholar 

  14. K. D. Rendulic and E. W. Müller, J. Appl. Phys. 38, 550–553 (1967).

    Article  CAS  Google Scholar 

  15. L. Nanis and P. Javet, J. Electrochem. Soc. 115, 509–511 (1968).

    Article  Google Scholar 

  16. O. T. Inal and A. E. Torma, Thin Solid Films 54, 161–169 (1978).

    Article  CAS  Google Scholar 

  17. O. T. Inal and A. E. Torma, J. Metals, 30, 16–19 (1978).

    CAS  Google Scholar 

  18. C. C. Schubert, C. L. Page, and B. Ralph, Electrochim. Acta 18, 33–38 (1972).

    Article  Google Scholar 

  19. H. Morikawa and Y. Yashiro, Proceedings Second International Conference on Solid Surfaces, Jpn. J. Appl. Phys., Supplement 2, 67 (1974).

    Google Scholar 

  20. . E. W. Müller and T. T. Tsong, Field Ion Microscopy, Principles and Applications, Elsevier, New York (1969): (a) Ch. IV, pp. 99-111; (b) pp. 119-120; (c) p. 123; (d) Ch. VI; (e) p. 289.

    Google Scholar 

  21. . K. M. Bowkett and D. A. Smith, Field Ion Microscopy, Elsevier, New York, 1970: (a) Appendix 3; (b) Appendix 5; (c) p. 30.

    Google Scholar 

  22. E. W. Müller, Surf. Sci. 8, 462–473 (1967).

    Article  Google Scholar 

  23. K. D. Rendulic and Z. Knor, Surf. Sci. 7, 205–214 (1967).

    Article  CAS  Google Scholar 

  24. K. D. Rendulic, Surf. Sci. 28, 285–298 (1971).

    Article  CAS  Google Scholar 

  25. E. D. Boyes and M. J. Southon, Vacuum 22, 447–451 (1972).

    Article  CAS  Google Scholar 

  26. J. J. Carroll and A. J. Melmed, Surf. Sci. 58, 601–604 (1976).

    Article  CAS  Google Scholar 

  27. D. G. Ast and D. N. Seidman, Surf. Sci. 28, 19–31 (1971).

    Article  CAS  Google Scholar 

  28. H. N. Southworth and B. Ralph, J. Microsc. 90, 167–197 (1969).

    Article  Google Scholar 

  29. . B. E. Conway, Theory and Principles of Electrode Processes, Ronald Press, New York (1975): (a) pp. 277–282; (b) p. 30.

    Google Scholar 

  30. D. A. Reed and W. R. Graham, Rev. Sci. Instrum. 43, 1365–1367 (1972).

    Article  CAS  Google Scholar 

  31. Varian Corp Micro-channel Plate Model VUW-8911K.

    Google Scholar 

  32. M. A. Fortes, Surf. Sci. 28, 117–131 (1971).

    Article  CAS  Google Scholar 

  33. R. M. Skomoroski, U.S. Patent 3,639, 219 (1972).

    Google Scholar 

  34. S. S. Brenner, Surf. Sci. 2, 496–508 (1964).

    Article  CAS  Google Scholar 

  35. A. K. Graham, Electroplating Engineering Handbook, p. 524, Van Nostrand-Reinhold, New York (1971).

    Google Scholar 

  36. A. Damjanovic and H. Brusic, Electrochim. Acta 12, 615–628 (1967).

    Article  CAS  Google Scholar 

  37. G. K. L. Cranstoun and D. R. Pyke, Appl. Surf. Sci. 2, 359–374 (1979).

    CAS  Google Scholar 

  38. G. K. L. Cranstoun and D. R. Pyke, Appl. Surf. Sci. 2, 375–381 (1979).

    CAS  Google Scholar 

  39. K. O’Leary, U.S. Patent 3,776, 834 (1973).

    Google Scholar 

  40. A. Damjanovic and V. Brusic, Electrochim. Acta 12, 1171 (1967).

    Article  CAS  Google Scholar 

  41. W. Polanschütz and E. Krautz, Surf. Sci. 46, 602–610 (1974).

    Article  Google Scholar 

  42. G. P. Harnwell, Principles of Electricity and Electromagnetism, p. 51, 2nd ed., McGraw-Hill, New York (1949).

    Google Scholar 

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Author information

Authors and Affiliations

  1. Electrochemical Engineering, 627 Georgia Avenue, Palo Alto, California, 94306, USA

    Leonard Nanis (Consultant)

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  1. Leonard Nanis
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Editors and Affiliations

  1. Texas A&M University, College Station, Texas, USA

    Ralph E. White  & J. O’M. Bockris  & 

  2. University of Ottawa, Ottawa, Ontario, Canada

    Brian E. Conway

  3. Case Western Reserve University, Cleveland, Ohio, USA

    Ernest Yeager

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© 1984 Plenum Press, New York

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Nanis, L. (1984). Field Ion Microscopy. In: White, R.E., Bockris, J.O., Conway, B.E., Yeager, E. (eds) Comprehensive Treatise of Electrochemistry. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-2679-3_9

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  • DOI: https://doi.org/10.1007/978-1-4613-2679-3_9

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4612-9667-6

  • Online ISBN: 978-1-4613-2679-3

  • eBook Packages: Springer Book Archive

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