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General Testing Techniques

  • Stuart K. Tewksbury
Part of the The Kluwer International Series in Engineering and Computer Science book series (SECS, volume 70)

Abstract

In this chapter, techniques to generate test stimuli, apply those test to circuit functions and to evaluate the test results [1,2,3,4] are reviewed. The emphasis is on general purpose schemes, such as scan path design of VLSI circuits and syndrome test compression. Special purpose testing schemes (e.g. [5,6,7,8]) developed for specific system functions (PLA’s, random access memories, linear matrix operations, etc) are considered separately in the next chapter.

Keywords

Test Vector Fault Coverage Linear Feedback Shift Register Clock Pulse Sequential Circuit 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Kluwer Academic Publishers 1989

Authors and Affiliations

  • Stuart K. Tewksbury
    • 1
  1. 1.AT&T Bell LaboratoriesUSA

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